Paper Abstract and Keywords |
Presentation |
2012-06-15 13:15
Study on Prevention of Trouble by Structure Analysis of LSI
-- The efforts for the reliability improvement of the electronic components for power plant -- Kazuya Murakami, Yuichi Sumimoto (Toshiba) R2012-11 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Electronic components to be applied to industrial products, it is necessary to be highly reliable. However, since the high-functionality, high-performance and diverse electronic components, it took some time to test reliability. Procurement of electronic components, foreign products have increased. We need to evaluate in a short period of time. In this report, we introduce a case analysis on the structure of the LSI to improve the reliability of electronic components. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
LSI / The reliability test / The structural analysis / The article of good quality analysis / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 82, R2012-11, pp. 1-5, June 2012. |
Paper # |
R2012-11 |
Date of Issue |
2012-06-08 (R) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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R2012-11 |
Conference Information |
Committee |
R |
Conference Date |
2012-06-15 - 2012-06-15 |
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(See Japanese page) |
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Paper Information |
Registration To |
R |
Conference Code |
2012-06-R |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Study on Prevention of Trouble by Structure Analysis of LSI |
Sub Title (in English) |
The efforts for the reliability improvement of the electronic components for power plant |
Keyword(1) |
LSI |
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The reliability test |
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The structural analysis |
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The article of good quality analysis |
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1st Author's Name |
Kazuya Murakami |
1st Author's Affiliation |
Toshiba Corporation (Toshiba) |
2nd Author's Name |
Yuichi Sumimoto |
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Toshiba Corporation (Toshiba) |
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Speaker |
Author-1 |
Date Time |
2012-06-15 13:15:00 |
Presentation Time |
25 minutes |
Registration for |
R |
Paper # |
R2012-11 |
Volume (vol) |
vol.112 |
Number (no) |
no.82 |
Page |
pp.1-5 |
#Pages |
5 |
Date of Issue |
2012-06-08 (R) |
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