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Paper Abstract and Keywords
Presentation 2012-06-15 13:15
Study on Prevention of Trouble by Structure Analysis of LSI -- The efforts for the reliability improvement of the electronic components for power plant --
Kazuya Murakami, Yuichi Sumimoto (Toshiba) R2012-11
Abstract (in Japanese) (See Japanese page) 
(in English) Electronic components to be applied to industrial products, it is necessary to be highly reliable. However, since the high-functionality, high-performance and diverse electronic components, it took some time to test reliability. Procurement of electronic components, foreign products have increased. We need to evaluate in a short period of time. In this report, we introduce a case analysis on the structure of the LSI to improve the reliability of electronic components.
Keyword (in Japanese) (See Japanese page) 
(in English) LSI / The reliability test / The structural analysis / The article of good quality analysis / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 82, R2012-11, pp. 1-5, June 2012.
Paper # R2012-11 
Date of Issue 2012-06-08 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee R  
Conference Date 2012-06-15 - 2012-06-15 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To R 
Conference Code 2012-06-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Study on Prevention of Trouble by Structure Analysis of LSI 
Sub Title (in English) The efforts for the reliability improvement of the electronic components for power plant 
Keyword(1) LSI  
Keyword(2) The reliability test  
Keyword(3) The structural analysis  
Keyword(4) The article of good quality analysis  
1st Author's Name Kazuya Murakami  
1st Author's Affiliation Toshiba Corporation (Toshiba)
2nd Author's Name Yuichi Sumimoto  
2nd Author's Affiliation Toshiba Corporation (Toshiba)
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Speaker Author-1 
Date Time 2012-06-15 13:15:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2012-11 
Volume (vol) vol.112 
Number (no) no.82 
Page pp.1-5 
Date of Issue 2012-06-08 (R) 

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