| 講演抄録／キーワード |
| 講演名 |
2012-06-27 18:00
Design of Small-Area and High-Reliability 512-Bit EEPROM IP and its Measurement
○Liyan Jin・Geon-Soo Yonn・Dong-Hoon Lee・Ji-Hye Jang・Mu-Hun Park・Pan-Bong Ha・Young-Hee Kim（Changwon National Univ.） エレソ技報アーカイブはこちら |
| 抄録 |
（和） |
In this paper, small-area and high-reliability design techniques of a 512-bit EEPROM are designed for UHF RFID tag chips. When small-area techniques such as a WL driver circuit simplifying its decoding logic and a VREF generator using a resistor divider instead of a BGR are applied, the layout size of the designed 512-bit EEPROM IP with the 0.18ァュ EEPROM is 59.465ァュ。ソ366.76ァュ which is 16.7% smaller than the conventional counterpart. Also, we solve a problem of breaking 5V devices by keeping VDDP voltage constant since a boosted output from a DC-DC converter is made discharge to the common ground VSS instead of VDDP (=3.15V) in getting out of the write mode. It is also verified that the designed EEPROM IP using the 0.18ァュ EEPROM functions normally. |
| （英） |
In this paper, small-area and high-reliability design techniques of a 512-bit EEPROM are designed for UHF RFID tag chips. When small-area techniques such as a WL driver circuit simplifying its decoding logic and a VREF generator using a resistor divider instead of a BGR are applied, the layout size of the designed 512-bit EEPROM IP with the 0.18ァュ EEPROM is 59.465ァュ。ソ366.76ァュ which is 16.7% smaller than the conventional counterpart. Also, we solve a problem of breaking 5V devices by keeping VDDP voltage constant since a boosted output from a DC-DC converter is made discharge to the common ground VSS instead of VDDP (=3.15V) in getting out of the write mode. It is also verified that the designed EEPROM IP using the 0.18ァュ EEPROM functions normally. |
| キーワード |
（和） |
UHF RFID / tag / EEPROM / small-area / high-reliability / / / |
| （英） |
UHF RFID / tag / EEPROM / small-area / high-reliability / / / |
| 文献情報 |
信学技報 |
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