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| Presentation | 2012-07-02 14:30 A Quantitative Approach of Soft Error Rate Estimation by Monte-Carlo Simulation Ken Yano, Takanori Hayashida, Toshinori Sato (Fukuokadai)  CAS2012-11 VLD2012-21 SIP2012-43 MSS2012-11 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In this paper a quantitative approach of SER(Soft Error Rate) of soft error rate estimation is proposed by Monte Carlo simulation by adopting a virtual particle irradiation model with in consideration of CMOS process variation. The proposed method is evaluated on normal Latch and SRAM and soft error tolerant Latch and SRAM. Although the soft error tolerant latch and SRAM introduced have sufficient tolerance about the soft error occurring at single node, they become vulnerable about the soft error which occurs in two or more different nodes during very short period of time. These characteristics are successfully evaluated by using proposed simulation method. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Soft Error / Single Event Upset / Monte-Carlo simulation / SER-Tolerant / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 114, VLD2012-21, pp. 61-66, July 2012. | |
| Paper # | VLD2012-21 | |
| Date of Issue | 2012-06-25 (CAS, VLD, SIP, MSS) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | CAS2012-11 VLD2012-21 SIP2012-43 MSS2012-11 |
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| Conference Information | |
| Committee | VLD CAS MSS SIP |
| Conference Date | 2012-07-02 - 2012-07-03 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kyoto Research Park |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | VLD |
| Conference Code | 2012-07-VLD-CAS-MSS-SIP |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Quantitative Approach of Soft Error Rate Estimation by Monte-Carlo Simulation |
| Sub Title (in English) | |
| Keyword(1) | Soft Error |
| Keyword(2) | Single Event Upset |
| Keyword(3) | Monte-Carlo simulation |
| Keyword(4) | SER-Tolerant |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Ken Yano |
| 1st Author's Affiliation | Fukuoka University (Fukuokadai) |
| 2nd Author's Name | Takanori Hayashida |
| 2nd Author's Affiliation | Fukuoka University (Fukuokadai) |
| 3rd Author's Name | Toshinori Sato |
| 3rd Author's Affiliation | Fukuoka University (Fukuokadai) |
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| Speaker | Author-1 |
| Date Time | 2012-07-02 14:30:00 |
| Presentation Time | 20 minutes |
| Registration for | VLD |
| Paper # | CAS2012-11, VLD2012-21, SIP2012-43, MSS2012-11 |
| Volume (vol) | vol.112 |
| Number (no) | no.113(CAS), no.114(VLD), no.115(SIP), no.116(MSS) |
| Page | pp.61-66 |
| #Pages | 6 |
| Date of Issue | 2012-06-25 (CAS, VLD, SIP, MSS) |
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