Paper Abstract and Keywords |
Presentation |
2012-07-20 13:15
Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms
-- Modeling about Fluctuation of Contact Resistance (24) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2012-42 EMD2012-17 Link to ES Tech. Rep. Archives: EMD2012-17 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a micro-oscillating on the contact resistance. Because it was necessary to deal with time-sequential data for analyzing the degradation phenomena of electrical contacts by the oscillating mechanisms, they tried to use non-linear data processing in addition to usually linear one. It is shown that smoothed time-sequential data is adapted to the logistic model and the data is adapted to a modified logistic model with a periodic element without smoothing very much. The data is fitted to the model by introducing a time-delay element to them. And it is shown that there are semi-stable limit cycles and bifurcation phenomenon in the time-sequential fluctuation using phase plane analysis by raw data themselves. It is suggested that there is some differences between data by rectangular input and those by sinusoidal one using phase plane analysis at neighboring lower limits of the amplitudes of the oscillation. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / time-sequential data / limit cycle / bifurcation / phase plane analysis |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 144, EMD2012-17, pp. 7-12, July 2012. |
Paper # |
EMD2012-17 |
Date of Issue |
2012-07-13 (EMCJ, EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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EMCJ2012-42 EMD2012-17 Link to ES Tech. Rep. Archives: EMD2012-17 |
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