Paper Abstract and Keywords |
Presentation |
2012-08-03 13:10
A Fast-Transient-Response Digital Low-Dropout Regulator Comprising Thin-Oxide MOS Transistors in 40-nm CMOS process Masafumi Onouchi, Kazuo Otsuga, Yasuto Igarashi, Toyohito Ikeya, Sadayuki Morita (Renesas Electronics), Koichiro Ishibashi (Univ. of Electro-Comm.), Kazumasa Yanagisawa (Renesas Electronics) SDM2012-82 ICD2012-50 Link to ES Tech. Rep. Archives: SDM2012-82 ICD2012-50 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
A digital low-dropout (LDO) regulator comprising only thin-oxide MOS transistors was developed. The input voltage to the LDO is set to be higher than the nominal overdrive voltage of thin-oxide MOS transistors by applying the proposed overdrive-voltage relaxation scheme. In the LDO, fast transient response can be achieved by applying an output capacitor-less design, which is based on power-MOS features as follows: 1-GHz switching and the small number of levels whereas a wide range of load current (400 $\mu$A - 250 mA) can be covered by applying the proposed power-MOS configuration. The LDO occupies only 0.057 mm$^2$ area using 40-nm CMOS technology, and the measured the transient response time is only 0.07 $\mu$s. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Low-dropout regulator / digital control / fast-transient response / DVFS / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 170, ICD2012-50, pp. 105-110, Aug. 2012. |
Paper # |
ICD2012-50 |
Date of Issue |
2012-07-26 (SDM, ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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SDM2012-82 ICD2012-50 Link to ES Tech. Rep. Archives: SDM2012-82 ICD2012-50 |
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