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Paper Abstract and Keywords
Presentation 2012-11-28 16:25
A Study on Test Generation for Effective Test Compaction
Yukino Kusuyama, Tatuya Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.), Koji Yamazaki (Meiji Univ.) VLD2012-105 DC2012-71
Abstract (in Japanese) (See Japanese page) 
(in English) In recent year, the numbers of target fault models and faults for testing increase because the number of gates on VLSIs is increasing and their complexity is growing with advances in semiconductor technology. As the result, the number of test patterns drastically increases. Many test compaction methods have been proposed to reduce the number of test patterns maintaining fault coverage. In this paper, we propose a dynamic test compaction method in which double detection, don’t care identification, and test pattern merge techniques are applied to a test set in a compaction buffer. We also propose a primary fault selection using influence cones for test generation to generate test patterns for faults which are predicted to be detected by test patterns with many care bits in an early stage. Experimental results for some small circuits of ISCAS’89 benchmark circuits show that the numbers of generated test patterns by our proposed methods are the almost same as the minimal numbers of test patterns.
Keyword (in Japanese) (See Japanese page) 
(in English) test compaction in a compaction buffer / influence cones for test generation / double detection / don’t care identification / fault selection / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 321, DC2012-71, pp. 267-272, Nov. 2012.
Paper # DC2012-71 
Date of Issue 2012-11-19 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2012-11-26 - 2012-11-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Centennial Hall Kyushu University School of Medicine 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2012 -New Field of VLSI Design- 
Paper Information
Registration To DC 
Conference Code 2012-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study on Test Generation for Effective Test Compaction 
Sub Title (in English)  
Keyword(1) test compaction in a compaction buffer  
Keyword(2) influence cones for test generation  
Keyword(3) double detection  
Keyword(4) don’t care identification  
Keyword(5) fault selection  
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1st Author's Name Yukino Kusuyama  
1st Author's Affiliation Nihon University (Nihon Univ.)
2nd Author's Name Tatuya Yamazaki  
2nd Author's Affiliation Nihon University (Nihon Univ.)
3rd Author's Name Toshinori Hosokawa  
3rd Author's Affiliation Nihon University (Nihon Univ.)
4th Author's Name Masayoshi Yoshimura  
4th Author's Affiliation Kyusyu University (Kyusyu Univ.)
5th Author's Name Koji Yamazaki  
5th Author's Affiliation Meiji University (Meiji Univ.)
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Speaker Author-1 
Date Time 2012-11-28 16:25:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # VLD2012-105, DC2012-71 
Volume (vol) vol.112 
Number (no) no.320(VLD), no.321(DC) 
Page pp.267-272 
#Pages
Date of Issue 2012-11-19 (VLD, DC) 


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