Paper Abstract and Keywords |
Presentation |
2012-11-28 16:25
A Study on Test Generation for Effective Test Compaction Yukino Kusuyama, Tatuya Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.), Koji Yamazaki (Meiji Univ.) VLD2012-105 DC2012-71 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In recent year, the numbers of target fault models and faults for testing increase because the number of gates on VLSIs is increasing and their complexity is growing with advances in semiconductor technology. As the result, the number of test patterns drastically increases. Many test compaction methods have been proposed to reduce the number of test patterns maintaining fault coverage. In this paper, we propose a dynamic test compaction method in which double detection, don’t care identification, and test pattern merge techniques are applied to a test set in a compaction buffer. We also propose a primary fault selection using influence cones for test generation to generate test patterns for faults which are predicted to be detected by test patterns with many care bits in an early stage. Experimental results for some small circuits of ISCAS’89 benchmark circuits show that the numbers of generated test patterns by our proposed methods are the almost same as the minimal numbers of test patterns. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
test compaction in a compaction buffer / influence cones for test generation / double detection / don’t care identification / fault selection / / / |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 321, DC2012-71, pp. 267-272, Nov. 2012. |
Paper # |
DC2012-71 |
Date of Issue |
2012-11-19 (VLD, DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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VLD2012-105 DC2012-71 |
Conference Information |
Committee |
VLD DC IPSJ-SLDM CPSY RECONF ICD CPM |
Conference Date |
2012-11-26 - 2012-11-28 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Centennial Hall Kyushu University School of Medicine |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Design Gaia 2012 -New Field of VLSI Design- |
Paper Information |
Registration To |
DC |
Conference Code |
2012-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A Study on Test Generation for Effective Test Compaction |
Sub Title (in English) |
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Keyword(1) |
test compaction in a compaction buffer |
Keyword(2) |
influence cones for test generation |
Keyword(3) |
double detection |
Keyword(4) |
don’t care identification |
Keyword(5) |
fault selection |
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1st Author's Name |
Yukino Kusuyama |
1st Author's Affiliation |
Nihon University (Nihon Univ.) |
2nd Author's Name |
Tatuya Yamazaki |
2nd Author's Affiliation |
Nihon University (Nihon Univ.) |
3rd Author's Name |
Toshinori Hosokawa |
3rd Author's Affiliation |
Nihon University (Nihon Univ.) |
4th Author's Name |
Masayoshi Yoshimura |
4th Author's Affiliation |
Kyusyu University (Kyusyu Univ.) |
5th Author's Name |
Koji Yamazaki |
5th Author's Affiliation |
Meiji University (Meiji Univ.) |
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Speaker |
Author-1 |
Date Time |
2012-11-28 16:25:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
VLD2012-105, DC2012-71 |
Volume (vol) |
vol.112 |
Number (no) |
no.320(VLD), no.321(DC) |
Page |
pp.267-272 |
#Pages |
6 |
Date of Issue |
2012-11-19 (VLD, DC) |
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