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Paper Abstract and Keywords
Presentation 2012-11-28 16:00
A Method to Estimate the Number of Don't-Care Bits with Netlist
Kohei Miyase, Seiji Kajihara, Xiaoqing Wen (KIT) VLD2012-104 DC2012-70
Abstract (in Japanese) (See Japanese page) 
(in English) X-filling is often utilized so as to achieve test compression, test power reduction, or test quality improvement etc.
in addition to fault detection. If X-filling cannot achieve sufficient results, we have to go back to the DFT and generate test
vectors again. In this paper, we present a method to predict effectiveness of X-filling by estimating the number of don't-care (X)
bits identified in test vectors. As the results, repeating the DFT and ATPG can be avoided due to insufficient results of X-filling.
Keyword (in Japanese) (See Japanese page) 
(in English) Test Generation / ATPG / Don't-Care Bit / LSI Design Flow / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 321, DC2012-70, pp. 261-266, Nov. 2012.
Paper # DC2012-70 
Date of Issue 2012-11-19 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2012-104 DC2012-70

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2012-11-26 - 2012-11-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Centennial Hall Kyushu University School of Medicine 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2012 -New Field of VLSI Design- 
Paper Information
Registration To DC 
Conference Code 2012-11-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Method to Estimate the Number of Don't-Care Bits with Netlist 
Sub Title (in English)  
Keyword(1) Test Generation  
Keyword(2) ATPG  
Keyword(3) Don't-Care Bit  
Keyword(4) LSI Design Flow  
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Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kohei Miyase  
1st Author's Affiliation Kyushu Institute of Technology (KIT)
2nd Author's Name Seiji Kajihara  
2nd Author's Affiliation Kyushu Institute of Technology (KIT)
3rd Author's Name Xiaoqing Wen  
3rd Author's Affiliation Kyushu Institute of Technology (KIT)
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Speaker Author-1 
Date Time 2012-11-28 16:00:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # VLD2012-104, DC2012-70 
Volume (vol) vol.112 
Number (no) no.320(VLD), no.321(DC) 
Page pp.261-266 
#Pages
Date of Issue 2012-11-19 (VLD, DC) 


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