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| Presentation | 2013-01-29 15:55 Pin prove position optimization through genetic algorithm in printed circuit board electrical inspections Masashi Morisawa, Hideki Katagiri (Hiroshima Univ.), Hiroshi Hamori (OHT), Kosuke Kato (Hiroshima Institute Tech)  CAS2012-90 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Pin probe inspection methods have been widely used in printed circuit board electrical inspection. In conventional methods, due to the miniaturization of electronic devices, operators need to correct pin probe positions many times so as to exactly contact each of pins with the corresponding bulged part (called a contact pad) of a wiring. This research proposes a new pin probe optimization system through a genetic algorithm that automatically correct pin probe positions. In the proposed system, an optimal correction amount of the pin probe position is calculated using several data on the current positions of contact pads and marks of pins selected by an operator, which is iteratively performed until the operator is satisfied with the pin probe position. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | printed circuit board / electrical inspection / position correction / narrow pitch / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 418, CAS2012-90, pp. 133-136, Jan. 2013. | |
| Paper # | CAS2012-90 | |
| Date of Issue | 2013-01-21 (CAS) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | CAS2012-90 |
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| Conference Information | |
| Committee | CAS |
| Conference Date | 2013-01-28 - 2013-01-29 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Beppu International Convention Center |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | General |
| Paper Information | |
| Registration To | CAS |
| Conference Code | 2013-01-CAS |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Pin prove position optimization through genetic algorithm in printed circuit board electrical inspections |
| Sub Title (in English) | |
| Keyword(1) | printed circuit board |
| Keyword(2) | electrical inspection |
| Keyword(3) | position correction |
| Keyword(4) | narrow pitch |
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| 1st Author's Name | Masashi Morisawa |
| 1st Author's Affiliation | Hiroshima University (Hiroshima Univ.) |
| 2nd Author's Name | Hideki Katagiri |
| 2nd Author's Affiliation | Hiroshima University (Hiroshima Univ.) |
| 3rd Author's Name | Hiroshi Hamori |
| 3rd Author's Affiliation | OHT Inc. (OHT) |
| 4th Author's Name | Kosuke Kato |
| 4th Author's Affiliation | Hiroshima Institute of Technology (Hiroshima Institute Tech) |
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| Speaker | Author-1 |
| Date Time | 2013-01-29 15:55:00 |
| Presentation Time | 20 minutes |
| Registration for | CAS |
| Paper # | CAS2012-90 |
| Volume (vol) | vol.112 |
| Number (no) | no.418 |
| Page | pp.133-136 |
| #Pages | 4 |
| Date of Issue | 2013-01-21 (CAS) |
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