IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-01-29 15:55
Pin prove position optimization through genetic algorithm in printed circuit board electrical inspections
Masashi Morisawa, Hideki Katagiri (Hiroshima Univ.), Hiroshi Hamori (OHT), Kosuke Kato (Hiroshima Institute Tech) CAS2012-90
Abstract (in Japanese) (See Japanese page) 
(in English) Pin probe inspection methods have been widely used in printed circuit board electrical inspection. In conventional methods, due to the miniaturization of electronic devices, operators need to correct pin probe positions many times so as to exactly contact each of pins with the corresponding bulged part (called a contact pad) of a wiring. This research proposes a new pin probe optimization system through a genetic algorithm that automatically correct pin probe positions. In the proposed system, an optimal correction amount of the pin probe position is calculated using several data on the current positions of contact pads and marks of pins selected by an operator, which is iteratively performed until the operator is satisfied with the pin probe position.
Keyword (in Japanese) (See Japanese page) 
(in English) printed circuit board / electrical inspection / position correction / narrow pitch / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 418, CAS2012-90, pp. 133-136, Jan. 2013.
Paper # CAS2012-90 
Date of Issue 2013-01-21 (CAS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CAS2012-90

Conference Information
Committee CAS  
Conference Date 2013-01-28 - 2013-01-29 
Place (in Japanese) (See Japanese page) 
Place (in English) Beppu International Convention Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General 
Paper Information
Registration To CAS 
Conference Code 2013-01-CAS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Pin prove position optimization through genetic algorithm in printed circuit board electrical inspections 
Sub Title (in English)  
Keyword(1) printed circuit board  
Keyword(2) electrical inspection  
Keyword(3) position correction  
Keyword(4) narrow pitch  
1st Author's Name Masashi Morisawa  
1st Author's Affiliation Hiroshima University (Hiroshima Univ.)
2nd Author's Name Hideki Katagiri  
2nd Author's Affiliation Hiroshima University (Hiroshima Univ.)
3rd Author's Name Hiroshi Hamori  
3rd Author's Affiliation OHT Inc. (OHT)
4th Author's Name Kosuke Kato  
4th Author's Affiliation Hiroshima Institute of Technology (Hiroshima Institute Tech)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2013-01-29 15:55:00 
Presentation Time 20 minutes 
Registration for CAS 
Paper # CAS2012-90 
Volume (vol) vol.112 
Number (no) no.418 
Page pp.133-136 
Date of Issue 2013-01-21 (CAS) 

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan