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| Presentation | 2013-02-13 15:50 A Method of Acceptable Fault Identification with Necessary Assignment in Logic Simplification for Error Tolerant Application Shingo Matsuki, Junpei Kamei, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.)  DC2012-88 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In error tolerant applications, some specific errors, which are of certain types or have severities within certain limits, of LSIs for such applications are tolerable. In this paper, we focus on logic optimization of circuits for error tolerant applications[10-12]. In the previous method, to identify removable portions of a logic circuit, the acceptability of stuck-at faults in the circuit is checked by utilizing threshold test generation algorithm, even though this acceptability identification is time-consuming[12]. To accelerate of this acceptability identification, we propose an acceptability identification procedure based on necessary assignments requires for detecting unacceptable faults. Discussing the relationship between multiple acceptable faults and necessary assignmetns, we present an algorithm, which is faster than the test-generation-based previous algorithm, to check the acceptability of faults with implication procedure. Experimental results show that the proposed algorithm can reduce the computation effort to identify acceptable faults. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | acceptable faults / logic optimization / error significance / acceptability identification / error tolerance / necessary assignment / / | |
| Reference Info. | IEICE Tech. Rep., vol. 112, no. 429, DC2012-88, pp. 49-54, Feb. 2013. | |
| Paper # | DC2012-88 | |
| Date of Issue | 2013-02-06 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2012-88 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2013-02-13 - 2013-02-13 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2013-02-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Method of Acceptable Fault Identification with Necessary Assignment in Logic Simplification for Error Tolerant Application |
| Sub Title (in English) | |
| Keyword(1) | acceptable faults |
| Keyword(2) | logic optimization |
| Keyword(3) | error significance |
| Keyword(4) | acceptability identification |
| Keyword(5) | error tolerance |
| Keyword(6) | necessary assignment |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Shingo Matsuki |
| 1st Author's Affiliation | Hiroshima City University (Hiroshima City Univ.) |
| 2nd Author's Name | Junpei Kamei |
| 2nd Author's Affiliation | Hiroshima City University (Hiroshima City Univ.) |
| 3rd Author's Name | Tsuyoshi Iwagaki |
| 3rd Author's Affiliation | Hiroshima City University (Hiroshima City Univ.) |
| 4th Author's Name | Hideyuki Ichihara |
| 4th Author's Affiliation | Hiroshima City University (Hiroshima City Univ.) |
| 5th Author's Name | Tomoo Inoue |
| 5th Author's Affiliation | Hiroshima City University (Hiroshima City Univ.) |
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| Speaker | Author-1 |
| Date Time | 2013-02-13 15:50:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2012-88 |
| Volume (vol) | vol.112 |
| Number (no) | no.429 |
| Page | pp.49-54 |
| #Pages | 6 |
| Date of Issue | 2013-02-06 (DC) |
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