Paper Abstract and Keywords |
Presentation |
2013-04-25 10:25
Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- Modeling about Fluctuation of Contact Resistance (4) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) NLP2013-2 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences of a micro-oscillating on the contact resistance. By using the mechanism, “Micro-Sliding Mechanism II”, which is developed on trial, they obtained time-sequential fluctuation data of contact voltage. It is shown that there are quasi-stable and periodic closed orbits and bifurcation phenomenon in the data by using phase plane analysis. It is indicated that the experimental data are able to be simulated by large and small theoretical rectangular wave in frequency. It is also shown that there are stable and periodic closed orbits and bifurcation phenomenon similar to the above in the theoretical data by using phase plane analysis and that there are different phenomena from the above. It is suggested that there is necessary to consider the non-linearity in the system for analyzing the differences caused by the fluctuation of amplitudes or frequencies and data jumping although the phenomena depend often upon the non-linearity of the inputs into the system. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / non-linearity / phase plane analysis / orbit / bifurcation |
Reference Info. |
IEICE Tech. Rep., vol. 113, no. 15, NLP2013-2, pp. 7-12, April 2013. |
Paper # |
NLP2013-2 |
Date of Issue |
2013-04-18 (NLP) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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NLP2013-2 |
Conference Information |
Committee |
NLP |
Conference Date |
2013-04-25 - 2013-04-25 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Nagoya campus, Chukyo University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
General |
Paper Information |
Registration To |
NLP |
Conference Code |
2013-04-NLP |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism |
Sub Title (in English) |
Modeling about Fluctuation of Contact Resistance (4) |
Keyword(1) |
electrical contact |
Keyword(2) |
micro-oscillation |
Keyword(3) |
contact resistance |
Keyword(4) |
micro-sliding mechanism |
Keyword(5) |
non-linearity |
Keyword(6) |
phase plane analysis |
Keyword(7) |
orbit |
Keyword(8) |
bifurcation |
1st Author's Name |
Shin-ichi Wada |
1st Author's Affiliation |
TMC System Co. Ltd. (TMC System) |
2nd Author's Name |
Keiji Koshida |
2nd Author's Affiliation |
TMC System Co. Ltd. (TMC System) |
3rd Author's Name |
Hiroaki Kubota |
3rd Author's Affiliation |
TMC System Co. Ltd. (TMC System) |
4th Author's Name |
Koichiro Sawa |
4th Author's Affiliation |
Nippon Institute of Technology (Nippon Inst. of Tech.) |
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Speaker |
Author-1 |
Date Time |
2013-04-25 10:25:00 |
Presentation Time |
25 minutes |
Registration for |
NLP |
Paper # |
NLP2013-2 |
Volume (vol) |
vol.113 |
Number (no) |
no.15 |
Page |
pp.7-12 |
#Pages |
6 |
Date of Issue |
2013-04-18 (NLP) |
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