IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2013-04-25 10:25
Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (4) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) NLP2013-2
Abstract (in Japanese) (See Japanese page) 
(in English) Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences of a micro-oscillating on the contact resistance. By using the mechanism, “Micro-Sliding Mechanism II”, which is developed on trial, they obtained time-sequential fluctuation data of contact voltage. It is shown that there are quasi-stable and periodic closed orbits and bifurcation phenomenon in the data by using phase plane analysis. It is indicated that the experimental data are able to be simulated by large and small theoretical rectangular wave in frequency. It is also shown that there are stable and periodic closed orbits and bifurcation phenomenon similar to the above in the theoretical data by using phase plane analysis and that there are different phenomena from the above. It is suggested that there is necessary to consider the non-linearity in the system for analyzing the differences caused by the fluctuation of amplitudes or frequencies and data jumping although the phenomena depend often upon the non-linearity of the inputs into the system.
Keyword (in Japanese) (See Japanese page) 
(in English) electrical contact / micro-oscillation / contact resistance / micro-sliding mechanism / non-linearity / phase plane analysis / orbit / bifurcation  
Reference Info. IEICE Tech. Rep., vol. 113, no. 15, NLP2013-2, pp. 7-12, April 2013.
Paper # NLP2013-2 
Date of Issue 2013-04-18 (NLP) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF NLP2013-2

Conference Information
Committee NLP  
Conference Date 2013-04-25 - 2013-04-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Nagoya campus, Chukyo University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) General 
Paper Information
Registration To NLP 
Conference Code 2013-04-NLP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism 
Sub Title (in English) Modeling about Fluctuation of Contact Resistance (4) 
Keyword(1) electrical contact  
Keyword(2) micro-oscillation  
Keyword(3) contact resistance  
Keyword(4) micro-sliding mechanism  
Keyword(5) non-linearity  
Keyword(6) phase plane analysis  
Keyword(7) orbit  
Keyword(8) bifurcation  
1st Author's Name Shin-ichi Wada  
1st Author's Affiliation TMC System Co. Ltd. (TMC System)
2nd Author's Name Keiji Koshida  
2nd Author's Affiliation TMC System Co. Ltd. (TMC System)
3rd Author's Name Hiroaki Kubota  
3rd Author's Affiliation TMC System Co. Ltd. (TMC System)
4th Author's Name Koichiro Sawa  
4th Author's Affiliation Nippon Institute of Technology (Nippon Inst. of Tech.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2013-04-25 10:25:00 
Presentation Time 25 minutes 
Registration for NLP 
Paper # NLP2013-2 
Volume (vol) vol.113 
Number (no) no.15 
Page pp.7-12 
#Pages
Date of Issue 2013-04-18 (NLP) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan