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| Presentation | 2013-06-21 16:30 A Method of Transistor Degradation Estimation Using Ring Oscillators Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.)  DC2013-15 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot Carrier (CHC) occurs in nanoscale transistors, which is a major factor for degrading the performance of LSIs. Operating speed of transistors is decreased by aging, and LSI malfunctions by a delay in signal propagation. In this paper, we present a method for estimating the amount of increase in delay time and a threshold value per one transistor from change in the period of two ring oscillators by aging. It was verified by circuit simulation that the proposed method can estimate with an error rate of less than 5% of the delay time increase and an error of less than 2% of the threshold voltage increase. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | NBTI / PBTI / CHC / ring oscillators / signal delay / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 104, DC2013-15, pp. 31-36, June 2013. | |
| Paper # | DC2013-15 | |
| Date of Issue | 2013-06-14 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2013-15 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2013-06-21 - 2013-06-21 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design, Test, Verification |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2013-06-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Method of Transistor Degradation Estimation Using Ring Oscillators |
| Sub Title (in English) | |
| Keyword(1) | NBTI |
| Keyword(2) | PBTI |
| Keyword(3) | CHC |
| Keyword(4) | ring oscillators |
| Keyword(5) | signal delay |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Tatsunori Ikeda |
| 1st Author's Affiliation | Tokyo Metropolitan University (Tokyo Metropolitan Univ.) |
| 2nd Author's Name | Yukiya Miura |
| 2nd Author's Affiliation | Tokyo Metropolitan University (Tokyo Metropolitan Univ.) |
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| Speaker | Author-1 |
| Date Time | 2013-06-21 16:30:00 |
| Presentation Time | 30 minutes |
| Registration for | DC |
| Paper # | DC2013-15 |
| Volume (vol) | vol.113 |
| Number (no) | no.104 |
| Page | pp.31-36 |
| #Pages | 6 |
| Date of Issue | 2013-06-14 (DC) |
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