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| Presentation | 2013-12-19 16:45 Discussions on Measurement Accuracy of Complex Relative Permittivity by a Balanced-type Circular Disk Resonator Method Jun Nakatsutsumi (Saitama Univ.), Yoshio Kobayashi (SUMTEC), Zhewang Ma (Saitama Univ.)  MW2013-163 Link to ES Tech. Rep. Archives: MW2013-163 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | A balanced-type circular disk resonator method is used for measuring complex permittivity in the normal direction (relative permittivity εrn, loss tangent tanδn) of a dielectric plate sample. Currently, to measure the frequency dependence of the complex permittivity, can be measured using the TM0m0 modes with different resonance frequency of a balanced-type circular disk resonator. This paper, at first of all, discusses improvement of measurement accuracy of the relative permittivity by taking the edge effect including thickness of a circular copper foil between COP substrates into account. Secondly, the effects of copper foil thickness and its circumference region on complex relative permittivity measurement are clarified from EM simulation and measurements. As a result, it is important for more accurate measurements to take these effects into account. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | microwave measurement / complex relative permittivity / dielectric substrates / edge effect / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 365, MW2013-163, pp. 71-76, Dec. 2013. | |
| Paper # | MW2013-163 | |
| Date of Issue | 2013-12-12 (MW) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | MW2013-163 Link to ES Tech. Rep. Archives: MW2013-163 |
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| Conference Information | |
| Committee | MW |
| Conference Date | 2013-12-19 - 2013-12-20 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Saitama Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave Technologies / Student |
| Paper Information | |
| Registration To | MW |
| Conference Code | 2013-12-MW |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Discussions on Measurement Accuracy of Complex Relative Permittivity by a Balanced-type Circular Disk Resonator Method |
| Sub Title (in English) | |
| Keyword(1) | microwave measurement |
| Keyword(2) | complex relative permittivity |
| Keyword(3) | dielectric substrates |
| Keyword(4) | edge effect |
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| 1st Author's Name | Jun Nakatsutsumi |
| 1st Author's Affiliation | Saitama University (Saitama Univ.) |
| 2nd Author's Name | Yoshio Kobayashi |
| 2nd Author's Affiliation | SUMTEC, Inc. (SUMTEC) |
| 3rd Author's Name | Zhewang Ma |
| 3rd Author's Affiliation | Saitama University (Saitama Univ.) |
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| Speaker | Author-1 |
| Date Time | 2013-12-19 16:45:00 |
| Presentation Time | 25 minutes |
| Registration for | MW |
| Paper # | MW2013-163 |
| Volume (vol) | vol.113 |
| Number (no) | no.365 |
| Page | pp.71-76 |
| #Pages | 6 |
| Date of Issue | 2013-12-12 (MW) |
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