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| Presentation | 2014-02-10 09:00 Module Coupling Overhead Aware Scan Chain Construction Meguru Komatsu, Hiroshi Iwata, Ken'ichi Yamaguchi (NNCT)  DC2013-79 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | It is necessary to minimize the impact on the layout of the design changes to Design for Testability (DFT). Especially, the skewed-load delay fault testing and asynchronous L1L2* scan design have constraints on the connection order of scan chains in order to improve the fault coverage. Therefore, module independences are missing because of the restrictions on the connection order of the scan chain. In this paper, we propose a scan chain construction method that takes into account the independence of the module. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Design for Testability / L1L2* Scan Design / scan cain / bipartite full scan design / module coupling overhead / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 113, no. 430, DC2013-79, pp. 1-5, Feb. 2014. | |
| Paper # | DC2013-79 | |
| Date of Issue | 2014-02-03 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2013-79 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2014-02-10 - 2014-02-10 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2014-02-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Module Coupling Overhead Aware Scan Chain Construction |
| Sub Title (in English) | |
| Keyword(1) | Design for Testability |
| Keyword(2) | L1L2* Scan Design |
| Keyword(3) | scan cain |
| Keyword(4) | bipartite full scan design |
| Keyword(5) | module coupling overhead |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Meguru Komatsu |
| 1st Author's Affiliation | Nara National College of Technology (NNCT) |
| 2nd Author's Name | Hiroshi Iwata |
| 2nd Author's Affiliation | Nara National College of Technology (NNCT) |
| 3rd Author's Name | Ken'ichi Yamaguchi |
| 3rd Author's Affiliation | Nara National College of Technology (NNCT) |
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| Speaker | Author-1 |
| Date Time | 2014-02-10 09:00:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2013-79 |
| Volume (vol) | vol.113 |
| Number (no) | no.430 |
| Page | pp.1-5 |
| #Pages | 5 |
| Date of Issue | 2014-02-03 (DC) |
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