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Paper Abstract and Keywords
Presentation 2014-06-20 16:00
A Binding Method for Hierarchical Testability Using Results of Test Environment Generation
Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) DC2014-16
Abstract (in Japanese) (See Japanese page) 
(in English) Hierarchical test generation methods using functional register-transfer level circuits have been proposed as efficient test generation methods for sequential circuits. In functional register-transfer level circuits, the behavior of each clock cycle is defined. Hierarchical test generation methods rapidly generate test sequences by using the behavior of functional register-transfer level circuits. On the other hand, functional register-transfer level circuits do not have circuit structures and their circuit structures are determined at binding step in behavioral synthesis. Therefore, fault coverage for test sequences generated by hierarchical test generation depends on the binding results. This paper proposes a binding method for hierarchical testability to increase the number of functional units with hierarchical testability and to improve fault coverage in hierarchical testing. Our proposed method performs functional unit binding and register binding by using results of test environment generation. Experimental results for example circuits and high level synthesis benchmark circuits show that the effectiveness of our proposed method.
Keyword (in Japanese) (See Japanese page) 
(in English) hierarchical test generation / test environments / behavioral synthesis / binding / functional register-transfer level / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 99, DC2014-16, pp. 39-44, June 2014.
Paper # DC2014-16 
Date of Issue 2014-06-13 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2014-06-20 - 2014-06-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design/Test/Verification 
Paper Information
Registration To DC 
Conference Code 2014-06-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Binding Method for Hierarchical Testability Using Results of Test Environment Generation 
Sub Title (in English)  
Keyword(1) hierarchical test generation  
Keyword(2) test environments  
Keyword(3) behavioral synthesis  
Keyword(4) binding  
Keyword(5) functional register-transfer level  
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1st Author's Name Jun Nishimaki  
1st Author's Affiliation Nihon University (Nihon Univ.)
2nd Author's Name Toshinori Hosokawa  
2nd Author's Affiliation Nihon University (Nihon Univ.)
3rd Author's Name Hideo Fujiwara  
3rd Author's Affiliation Osaka Gakuin University (Osaka Gakuin Univ.)
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Date Time 2014-06-20 16:00:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2014-16 
Volume (vol) vol.114 
Number (no) no.99 
Page pp.39-44 
#Pages
Date of Issue 2014-06-13 (DC) 


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