Paper Abstract and Keywords |
Presentation |
2014-08-22 16:35
Degradation phenomenon of electrical contacts by a micro-sliding mechanism
-- The comparison of the evaluated minimal sliding amplitudes under some conditions (2) -- Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) R2014-51 EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55 Link to ES Tech. Rep. Archives: EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Authors have developed a hammering oscillating mechanism which gives micro-oscillation to electrical
contacts, and have experimented. In addition, we have developed micro-sliding mechanisms for comparisons with
oscillation experiments. And we have discussed the in
uence of the micro-sliding or micro-oscillation on the resis-
tance of the connector pins. It is indicated that there are minimal sliding amplitudes or driving amplitudes within
21.5 hours by the sliding experiments. In this paper, we report statistical analyses for its minimal amplitudes.
Statistical analyses are carried out for the estimation of population mean values and analysis of variance. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
electrical contact / contact resistance / micro-sliding mechanism / statistics analysis / analysis of variance / point estimation / interval estimation / |
Reference Info. |
IEICE Tech. Rep., vol. 114, no. 184, EMD2014-56, pp. 145-150, Aug. 2014. |
Paper # |
EMD2014-56 |
Date of Issue |
2014-08-14 (R, EMD, CPM, OPE, LQE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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R2014-51 EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55 Link to ES Tech. Rep. Archives: EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55 |
Conference Information |
Committee |
EMD LQE OPE CPM R |
Conference Date |
2014-08-21 - 2014-08-22 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Otaru Economy Center |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
EMD |
Conference Code |
2014-08-EMD-LQE-OPE-CPM-R |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Degradation phenomenon of electrical contacts by a micro-sliding mechanism |
Sub Title (in English) |
The comparison of the evaluated minimal sliding amplitudes under some conditions (2) |
Keyword(1) |
electrical contact |
Keyword(2) |
contact resistance |
Keyword(3) |
micro-sliding mechanism |
Keyword(4) |
statistics analysis |
Keyword(5) |
analysis of variance |
Keyword(6) |
point estimation |
Keyword(7) |
interval estimation |
Keyword(8) |
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1st Author's Name |
Keiji Koshida |
1st Author's Affiliation |
TMC System Co. Ltd. (TMC System) |
2nd Author's Name |
Shin-ichi Wada |
2nd Author's Affiliation |
TMC System Co. Ltd. (TMC System) |
3rd Author's Name |
Hiroaki Kubota |
3rd Author's Affiliation |
TMC System Co. Ltd. (TMC System) |
4th Author's Name |
Koichiro Sawa |
4th Author's Affiliation |
Nippon Institute of Technology (Nippon Inst. of Tech.) |
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Speaker |
Author-2 |
Date Time |
2014-08-22 16:35:00 |
Presentation Time |
20 minutes |
Registration for |
EMD |
Paper # |
R2014-51, EMD2014-56, CPM2014-71, OPE2014-81, LQE2014-55 |
Volume (vol) |
vol.114 |
Number (no) |
no.183(R), no.184(EMD), no.185(CPM), no.186(OPE), no.187(LQE) |
Page |
pp.145-150 |
#Pages |
6 |
Date of Issue |
2014-08-14 (R, EMD, CPM, OPE, LQE) |
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