Paper Abstract and Keywords |
Presentation |
2014-10-17 13:50
Analysis of trap density causing random telegraph noise in MOSFETs Toshiki Obara, Akinobu Teramoto, Rihito Kuroda, Akihiro Yonezawa, Tetsuya Goto, Tomoyuki Suwa, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.) SDM2014-93 Link to ES Tech. Rep. Archives: SDM2014-93 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The incidence ratio of Random Telegraph Noise in 131,072 MOSFETs was evaluated statistically by using array test circuit. The Correlation between multi traps in three and four states RTN were evaluated and the number and density of traps that cause RTN were extracted. These analyzing methods are very effective to analyze RTN for reducing it. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
MOSFET / Random Telegraph Noise / Trap Density / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 114, no. 255, SDM2014-93, pp. 55-59, Oct. 2014. |
Paper # |
SDM2014-93 |
Date of Issue |
2014-10-09 (SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SDM2014-93 Link to ES Tech. Rep. Archives: SDM2014-93 |
Conference Information |
Committee |
SDM |
Conference Date |
2014-10-16 - 2014-10-17 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Niche, Tohoku Univ. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Process Science and New Process Technology |
Paper Information |
Registration To |
SDM |
Conference Code |
2014-10-SDM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Analysis of trap density causing random telegraph noise in MOSFETs |
Sub Title (in English) |
|
Keyword(1) |
MOSFET |
Keyword(2) |
Random Telegraph Noise |
Keyword(3) |
Trap Density |
Keyword(4) |
|
Keyword(5) |
|
Keyword(6) |
|
Keyword(7) |
|
Keyword(8) |
|
1st Author's Name |
Toshiki Obara |
1st Author's Affiliation |
Tohoku University (Tohoku Univ.) |
2nd Author's Name |
Akinobu Teramoto |
2nd Author's Affiliation |
Tohoku University (Tohoku Univ.) |
3rd Author's Name |
Rihito Kuroda |
3rd Author's Affiliation |
Tohoku University (Tohoku Univ.) |
4th Author's Name |
Akihiro Yonezawa |
4th Author's Affiliation |
Tohoku University (Tohoku Univ.) |
5th Author's Name |
Tetsuya Goto |
5th Author's Affiliation |
Tohoku University (Tohoku Univ.) |
6th Author's Name |
Tomoyuki Suwa |
6th Author's Affiliation |
Tohoku University (Tohoku Univ.) |
7th Author's Name |
Shigetoshi Sugawa |
7th Author's Affiliation |
Tohoku University (Tohoku Univ.) |
8th Author's Name |
Tadahiro Ohmi |
8th Author's Affiliation |
Tohoku University (Tohoku Univ.) |
9th Author's Name |
|
9th Author's Affiliation |
() |
10th Author's Name |
|
10th Author's Affiliation |
() |
11th Author's Name |
|
11th Author's Affiliation |
() |
12th Author's Name |
|
12th Author's Affiliation |
() |
13th Author's Name |
|
13th Author's Affiliation |
() |
14th Author's Name |
|
14th Author's Affiliation |
() |
15th Author's Name |
|
15th Author's Affiliation |
() |
16th Author's Name |
|
16th Author's Affiliation |
() |
17th Author's Name |
|
17th Author's Affiliation |
() |
18th Author's Name |
|
18th Author's Affiliation |
() |
19th Author's Name |
|
19th Author's Affiliation |
() |
20th Author's Name |
|
20th Author's Affiliation |
() |
Speaker |
Author-1 |
Date Time |
2014-10-17 13:50:00 |
Presentation Time |
30 minutes |
Registration for |
SDM |
Paper # |
SDM2014-93 |
Volume (vol) |
vol.114 |
Number (no) |
no.255 |
Page |
pp.55-59 |
#Pages |
5 |
Date of Issue |
2014-10-09 (SDM) |
|