Paper Abstract and Keywords |
Presentation |
2015-02-13 16:00
An Evalution of a Fault Diagnosis Method for Single Logical Faults Using Multi Cycle Capture Test Sets Hideyuki Takano, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) DC2014-86 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Multi-cycle capture testing has been proposed to improve test quality of scan testing. However, fault diagnosis for multi-cycle capture testing has not been established. In this paper, a fault diagnosis method for single logical faults using multi-cycle capture test sets is proposed and evaluated. Erroneous path tracing and fault simulation methods which are fault diagnosis for single-cycle capture testing are expanded to one for multi-cycle capture testing, and the number of suspected faults is evaluated. Experimental results show the relationship among the number of cycles for capture, the number of suspected faults, and fault diagnosis time. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Fault Diagnosis / Logical Fault / Multi-cycle Capture Test / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 114, no. 446, DC2014-86, pp. 49-54, Feb. 2015. |
Paper # |
DC2014-86 |
Date of Issue |
2015-02-06 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
DC2014-86 |
Conference Information |
Committee |
DC |
Conference Date |
2015-02-13 - 2015-02-13 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
VLSI Design and Test, etc |
Paper Information |
Registration To |
DC |
Conference Code |
2015-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
An Evalution of a Fault Diagnosis Method for Single Logical Faults Using Multi Cycle Capture Test Sets |
Sub Title (in English) |
|
Keyword(1) |
Fault Diagnosis |
Keyword(2) |
Logical Fault |
Keyword(3) |
Multi-cycle Capture Test |
Keyword(4) |
|
Keyword(5) |
|
Keyword(6) |
|
Keyword(7) |
|
Keyword(8) |
|
1st Author's Name |
Hideyuki Takano |
1st Author's Affiliation |
Nihon University (Nihon Univ.) |
2nd Author's Name |
Hiroshi Yamazaki |
2nd Author's Affiliation |
Nihon University (Nihon Univ.) |
3rd Author's Name |
Toshinori Hosokawa |
3rd Author's Affiliation |
Nihon University (Nihon Univ.) |
4th Author's Name |
Koji Yamazaki |
4th Author's Affiliation |
Meiji University (Meiji Univ.) |
5th Author's Name |
|
5th Author's Affiliation |
() |
6th Author's Name |
|
6th Author's Affiliation |
() |
7th Author's Name |
|
7th Author's Affiliation |
() |
8th Author's Name |
|
8th Author's Affiliation |
() |
9th Author's Name |
|
9th Author's Affiliation |
() |
10th Author's Name |
|
10th Author's Affiliation |
() |
11th Author's Name |
|
11th Author's Affiliation |
() |
12th Author's Name |
|
12th Author's Affiliation |
() |
13th Author's Name |
|
13th Author's Affiliation |
() |
14th Author's Name |
|
14th Author's Affiliation |
() |
15th Author's Name |
|
15th Author's Affiliation |
() |
16th Author's Name |
|
16th Author's Affiliation |
() |
17th Author's Name |
|
17th Author's Affiliation |
() |
18th Author's Name |
|
18th Author's Affiliation |
() |
19th Author's Name |
|
19th Author's Affiliation |
() |
20th Author's Name |
|
20th Author's Affiliation |
() |
Speaker |
Author-1 |
Date Time |
2015-02-13 16:00:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2014-86 |
Volume (vol) |
vol.114 |
Number (no) |
no.446 |
Page |
pp.49-54 |
#Pages |
6 |
Date of Issue |
2015-02-06 (DC) |
|