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Paper Abstract and Keywords
Presentation 2015-12-01 12:45
Scan Segmentation Approach to Magnify Detection Sensitivity for Tiny Hardware Trojan
Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST) VLD2015-38 DC2015-34
Abstract (in Japanese) (See Japanese page) 
(in English) Outsourcing of IC fabrication components has initiated the potential threat of design tempering using hardware Trojans and also has drawn the attention of government agencies and the semiconductor industry. The added functionality, known as hardware Trojan, poses major detection and isolation challenges. This paper presents a hardware Trojan detection technique that magnifies the detection sensitivity for small Trojan in power-based side-channel analysis. A scan segmentation approach with a modified LOC test pattern application method is proposed so as to maximize dynamic power consumption of any target segment. The proposed architecture allows activating any target segment of scan chain and keeping others freeze which reduces total circuit switching activity. This helps magnify the Trojan’s contribution to selected segment by reducing dynamic power consumption. Experimental results for ISCAS89 benchmark circuit demonstrate its effectiveness in side-channel analysis.
Keyword (in Japanese) (See Japanese page) 
(in English) Trojan Detection / Scan Reordering / Launch on Capture (LOC) / Dynamic Power Side-Channel / TDGP / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 339, DC2015-34, pp. 1-6, Dec. 2015.
Paper # DC2015-34 
Date of Issue 2015-11-24 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2015-38 DC2015-34

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2015-12-01 - 2015-12-03 
Place (in Japanese) (See Japanese page) 
Place (in English) Nagasaki Kinro Fukushi Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2015 -New Field of VLSI Design- 
Paper Information
Registration To DC 
Conference Code 2015-12-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Scan Segmentation Approach to Magnify Detection Sensitivity for Tiny Hardware Trojan 
Sub Title (in English)  
Keyword(1) Trojan Detection  
Keyword(2) Scan Reordering  
Keyword(3) Launch on Capture (LOC)  
Keyword(4) Dynamic Power Side-Channel  
Keyword(5) TDGP  
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1st Author's Name Fakir Sharif Hossain  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Tomokazu Yoneda  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Michiko Inoue  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2015-12-01 12:45:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # VLD2015-38, DC2015-34 
Volume (vol) vol.115 
Number (no) no.338(VLD), no.339(DC) 
Page pp.1-6 
#Pages
Date of Issue 2015-11-24 (VLD, DC) 


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