IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2016-03-02 14:30
[Poster Presentation] Evaluation of SIFT feature based watermarking method for scaling and rotation attacks
Kouta Uchida, Masaki Kawamura (Yamaguchi Univ.) EMM2015-77
Abstract (in Japanese) (See Japanese page) 
(in English) We evaluate SIFT feature based watermarking method for scaling and rotation attacks. In digital watermarking, it is required to extract watermarks from image distorted by geometric attacks. Information Hiding Criteria (IHC) Committee defined the evaluation criteria. The criteria requires that the watermarks can be extracted from the image distorted by scaling, rotation, JPEG compression and their combinations. In version 4, parameters of rotation angles and rate of scaling are known to decoders. However, these parameters are unknown or blinded in many situations. Therefore, blind watermark methods are required. Once the stego-images are attacked by scaling or rotation, it is hard to extract the watermarks due to misalignment of coordinate system. We focus on the method based on SIFT feature, which has invariance for scaling and rotation. In our method, invariant regions for scaling around the SIFT feature points are used for embedding. The watermarks are embedded into DCT domain of the invariant regions to endure JPEG compression. In extracting, the rotation angle is searched by brute force. We evaluated the method by IHC criteria. As a result, our method can achieve zero bit error rate for these attacks.
Keyword (in Japanese) (See Japanese page) 
(in English) digital watermark / SIFT / scaling / rotation / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 479, EMM2015-77, pp. 7-12, March 2016.
Paper # EMM2015-77 
Date of Issue 2016-02-24 (EMM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMM2015-77

Conference Information
Committee EMM  
Conference Date 2016-03-02 - 2016-03-03 
Place (in Japanese) (See Japanese page) 
Place (in English) Yakushima Environ. and Cultural Vill. Center 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Image and Sound Quality, Metrics for Perception and Recognition, Human Auditory and Visual System, etc. 
Paper Information
Registration To EMM 
Conference Code 2016-03-EMM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Evaluation of SIFT feature based watermarking method for scaling and rotation attacks 
Sub Title (in English)  
Keyword(1) digital watermark  
Keyword(2) SIFT  
Keyword(3) scaling  
Keyword(4) rotation  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kouta Uchida  
1st Author's Affiliation Yamaguchi University (Yamaguchi Univ.)
2nd Author's Name Masaki Kawamura  
2nd Author's Affiliation Yamaguchi University (Yamaguchi Univ.)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2016-03-02 14:30:00 
Presentation Time 60 minutes 
Registration for EMM 
Paper # EMM2015-77 
Volume (vol) vol.115 
Number (no) no.479 
Page pp.7-12 
#Pages
Date of Issue 2016-02-24 (EMM) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan