Paper Abstract and Keywords |
Presentation |
2016-04-15 10:55
[Invited Talk]
A 90nm Embedded 1T-MONOS Flash Macro for Automotive Applications with 0.07mJ/8kB Rewrite Energy and Endurance Over 100M Cycles Under Tj of 175°C Satoru Nakanishi, Hidenori Mitani, Ken Matsubara, Hiroshi Yoshida, Takashi Kono, Yasuhiko Taito, Takashi Ito, Takashi Kurafuji, Kenji Noguchi, Hideto Hidaka, Tadaaki Yamauchi (Renesas) ICD2016-15 Link to ES Tech. Rep. Archives: ICD2016-15 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
A first-ever 90nm embedded 1T-MONOS Flash macro is presented to realize automotive reliability and simple process integration. Read Disturb Free Array Architecture fully solves conventional read disturb issue in 1T-MONOS for automotive use. Adaptable Slope Pulse Control (ASPC) technique can achieve endurance over 100M cycles at Tj = 175°C and P/E current of only 98uA. Idling P/E Management Unit (IPEMU) scheme can reduce power consumption in Automotive Analog system by 99%. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
for Automotive / embedded Flash memory / high P/E endurance / low power consumption / 1T-MONOS / / / |
Reference Info. |
IEICE Tech. Rep., vol. 116, no. 3, ICD2016-15, pp. 77-81, April 2016. |
Paper # |
ICD2016-15 |
Date of Issue |
2016-04-07 (ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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ICD2016-15 Link to ES Tech. Rep. Archives: ICD2016-15 |