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| Presentation | 2016-05-19 13:30 Highly accurate depth estimation using Multi-scale EPI Analysis Takahiro Suzuki, Keita Takahashi, Toshiaki Fujii (Nagoya Univ.)  SIP2016-2 IE2016-2 PRMU2016-2 MI2016-2 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Structure tensor analysis on epipolar plane images (EPIs) is a successful appproach to estimate disparity from a light field, i.e. a dense set of multi-view images. However, the disparity range allowable for the light field is limited, because the estimation becomes less accurate as the range of disparities become larger. To overcome this limitation, we proposed a new method called Sheared EPI Analysis, where EPIs are sheared before the structure tensor analysis. The results of analysis obtained with different shear values are integrated into a final disparity map. To further improve the method, in this paper, we introduce a multi-scale approach to the EPI analysis. Our method can successfully handle different texture frequencies while keeping the increase of computational cost low, resulting in more accurate disparity estimation. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Epipolar Plane Image / Light field / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 116, no. 37, IE2016-2, pp. 5-10, May 2016. | |
| Paper # | IE2016-2 | |
| Date of Issue | 2016-05-12 (SIP, IE, PRMU, MI) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SIP2016-2 IE2016-2 PRMU2016-2 MI2016-2 |
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| Conference Information | |
| Committee | PRMU IE MI SIP |
| Conference Date | 2016-05-19 - 2016-05-20 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | IE |
| Conference Code | 2016-05-PRMU-IE-MI-SIP |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Highly accurate depth estimation using Multi-scale EPI Analysis |
| Sub Title (in English) | |
| Keyword(1) | Epipolar Plane Image |
| Keyword(2) | Light field |
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| 1st Author's Name | Takahiro Suzuki |
| 1st Author's Affiliation | Nagoya University (Nagoya Univ.) |
| 2nd Author's Name | Keita Takahashi |
| 2nd Author's Affiliation | Nagoya University (Nagoya Univ.) |
| 3rd Author's Name | Toshiaki Fujii |
| 3rd Author's Affiliation | Nagoya University (Nagoya Univ.) |
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| Speaker | Author-1 |
| Date Time | 2016-05-19 13:30:00 |
| Presentation Time | 30 minutes |
| Registration for | IE |
| Paper # | SIP2016-2, IE2016-2, PRMU2016-2, MI2016-2 |
| Volume (vol) | vol.116 |
| Number (no) | no.36(SIP), no.37(IE), no.38(PRMU), no.39(MI) |
| Page | pp.5-10 |
| #Pages | 6 |
| Date of Issue | 2016-05-12 (SIP, IE, PRMU, MI) |
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