Paper Abstract and Keywords |
Presentation |
2016-06-16 10:30
On random test pattern generation algorithm considering signal transition activities Yusuke Matsunaga (Kyushu Univ.) CAS2016-4 VLD2016-10 SIP2016-38 MSS2016-4 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This paper presents a test pattern generation method with considering
signal transition activities using Markov chain Monte-Carlo method.
Experimental results show that the number of detected faults using the
proposed method is compatible to the existing method which does not
consider signal transition activities, however, the number patterns
is likely to increase. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
test pattern generation / signal transition activity / Markov chain Monte-Carlo algorithm / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 116, no. 94, VLD2016-10, pp. 19-22, June 2016. |
Paper # |
VLD2016-10 |
Date of Issue |
2016-06-09 (CAS, VLD, SIP, MSS) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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CAS2016-4 VLD2016-10 SIP2016-38 MSS2016-4 |
Conference Information |
Committee |
VLD CAS MSS SIP |
Conference Date |
2016-06-16 - 2016-06-17 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hirosaki Shiritsu Kanko-kan |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
System, signal processing and related topics |
Paper Information |
Registration To |
VLD |
Conference Code |
2016-06-VLD-CAS-MSS-SIP |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
On random test pattern generation algorithm considering signal transition activities |
Sub Title (in English) |
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Keyword(1) |
test pattern generation |
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signal transition activity |
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Markov chain Monte-Carlo algorithm |
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1st Author's Name |
Yusuke Matsunaga |
1st Author's Affiliation |
Kyushu University (Kyushu Univ.) |
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Speaker |
Author-1 |
Date Time |
2016-06-16 10:30:00 |
Presentation Time |
20 minutes |
Registration for |
VLD |
Paper # |
CAS2016-4, VLD2016-10, SIP2016-38, MSS2016-4 |
Volume (vol) |
vol.116 |
Number (no) |
no.93(CAS), no.94(VLD), no.95(SIP), no.96(MSS) |
Page |
pp.19-22 |
#Pages |
4 |
Date of Issue |
2016-06-09 (CAS, VLD, SIP, MSS) |
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