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Paper Abstract and Keywords
Presentation 2016-06-17 15:30
Thermal Analysis in 3D ICs
Kaoru Furumi, Masashi Imai, Nanako Niioka, Atsushi Kurokawa (Hirosaki Univ.) CAS2016-32 VLD2016-38 SIP2016-66 MSS2016-32
Abstract (in Japanese) (See Japanese page) 
(in English) Three-dimensional integrated circuits (3D ICs) lead to higher power densities than 2D ICs because of the stacking of multiple device layers. Thermal issue is one of the critical challenges in the field of 3D ICs. Since temperature affects signal delay and chip reliability, it is very important to clarify the impacts of various parameters on the maximum temperature in a 3D IC. In this report, we present several useful results obtained by thermal analysis with varying physical and material parameters of through-silicon-via (TSV) based 3D ICs.
Keyword (in Japanese) (See Japanese page) 
(in English) Thermal Analysis / 3D IC / Through Silicon Vias (TSVs) / Heat Sink / / / /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 94, VLD2016-38, pp. 173-178, June 2016.
Paper # VLD2016-38 
Date of Issue 2016-06-09 (CAS, VLD, SIP, MSS) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CAS2016-32 VLD2016-38 SIP2016-66 MSS2016-32

Conference Information
Committee VLD CAS MSS SIP  
Conference Date 2016-06-16 - 2016-06-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Hirosaki Shiritsu Kanko-kan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) System, signal processing and related topics 
Paper Information
Registration To VLD 
Conference Code 2016-06-VLD-CAS-MSS-SIP 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Thermal Analysis in 3D ICs 
Sub Title (in English)  
Keyword(1) Thermal Analysis  
Keyword(2) 3D IC  
Keyword(3) Through Silicon Vias (TSVs)  
Keyword(4) Heat Sink  
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1st Author's Name Kaoru Furumi  
1st Author's Affiliation Hirosaki University (Hirosaki Univ.)
2nd Author's Name Masashi Imai  
2nd Author's Affiliation Hirosaki University (Hirosaki Univ.)
3rd Author's Name Nanako Niioka  
3rd Author's Affiliation Hirosaki University (Hirosaki Univ.)
4th Author's Name Atsushi Kurokawa  
4th Author's Affiliation Hirosaki University (Hirosaki Univ.)
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Speaker Author-1 
Date Time 2016-06-17 15:30:00 
Presentation Time 20 minutes 
Registration for VLD 
Paper # CAS2016-32, VLD2016-38, SIP2016-66, MSS2016-32 
Volume (vol) vol.116 
Number (no) no.93(CAS), no.94(VLD), no.95(SIP), no.96(MSS) 
Page pp.173-178 
#Pages
Date of Issue 2016-06-09 (CAS, VLD, SIP, MSS) 


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