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Paper Abstract and Keywords
Presentation 2016-12-16 11:40
[Memorial Lecture] Determination of internal quantum efficiency and recombination lifetime by simultaneous photo-acoustic and photoluminescence measurements in GaN
Kohei Kawakami, Takashi Nakano, Atsushi A. Yamaguchi (Kanazawa Inst. Tech.) LQE2016-99 Link to ES Tech. Rep. Archives: LQE2016-99
Abstract (in Japanese) (See Japanese page) 
(in English) Internal quantum efficiency (IQE) is usually estimated from temperature dependence of photoluminescence (PL) intensity by assuming that the IQE at cryogenic temperature is unity. III-nitride samples, however, usually have large defect-density, and the assumption is not necessarily valid. In this study, we have developed a new method to estimate accurate IQE values by simultaneous PL and photo-acoustic (PA) measurements, and have demonstratively evaluated the IQE values for various GaN samples. The results show that the conventional method cannot give accurate IQE values for low-quality samples although it can be valid for high-quality samples, and that our method can always give accurate values. Furthermore, we have performed time-resolved PL measurements for the GaN samples and have estimated radiative and non-radiative recombination lifetimes by using the reliable IQE values estimated by the simultaneous PL/PA measurements, and it is found that radiative lifetime in GaN increases in proportion to the 1.5th power of temperature and that non-radiative lifetime shows little temperature dependence although the non-radiative lifetime itself largely depends on sample quality.
Keyword (in Japanese) (See Japanese page) 
(in English) Nitride / GaN / PAS / IQE / Decay / Recombination / nonradiative /  
Reference Info. IEICE Tech. Rep., vol. 116, no. 372, LQE2016-99, pp. 15-20, Dec. 2016.
Paper # LQE2016-99 
Date of Issue 2016-12-09 (LQE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Download PDF LQE2016-99 Link to ES Tech. Rep. Archives: LQE2016-99

Conference Information
Committee LQE  
Conference Date 2016-12-16 - 2016-12-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To LQE 
Conference Code 2016-12-LQE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Determination of internal quantum efficiency and recombination lifetime by simultaneous photo-acoustic and photoluminescence measurements in GaN 
Sub Title (in English)  
Keyword(1) Nitride  
Keyword(2) GaN  
Keyword(3) PAS  
Keyword(4) IQE  
Keyword(5) Decay  
Keyword(6) Recombination  
Keyword(7) nonradiative  
Keyword(8)  
1st Author's Name Kohei Kawakami  
1st Author's Affiliation Kanazawa Institute of Technology (Kanazawa Inst. Tech.)
2nd Author's Name Takashi Nakano  
2nd Author's Affiliation Kanazawa Institute of Technology (Kanazawa Inst. Tech.)
3rd Author's Name Atsushi A. Yamaguchi  
3rd Author's Affiliation Kanazawa Institute of Technology (Kanazawa Inst. Tech.)
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Speaker Author-3 
Date Time 2016-12-16 11:40:00 
Presentation Time 25 minutes 
Registration for LQE 
Paper # LQE2016-99 
Volume (vol) vol.116 
Number (no) no.372 
Page pp.15-20 
#Pages
Date of Issue 2016-12-09 (LQE) 


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