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| Presentation | 2017-03-03 14:45 Observation of whisker growth in various tin plating Yuki Wada, Kazuo Iida (Mie Univ.), Takafumi Akashi (ASAHI PLATING)  EMD2016-105 Link to ES Tech. Rep. Archives: EMD2016-105 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Reliability of connection is required for connectors, and tin is widely used for surface treatment. However, in the plating of pure tin, a rod-shaped tin crystal whisker may cause a contact failure such as a short circuit. Therefore, in this laboratory, we investigated the influence of plating condition such as plating type, plating film thickness and underlying plating on whisker growth. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Conector / Tin / Plate / Whisker / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 116, no. 492, EMD2016-105, pp. 25-28, March 2017. | |
| Paper # | EMD2016-105 | |
| Date of Issue | 2017-02-24 (EMD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EMD2016-105 Link to ES Tech. Rep. Archives: EMD2016-105 |
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| Conference Information | |
| Committee | EMD |
| Conference Date | 2017-03-03 - 2017-03-03 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EMD |
| Conference Code | 2017-03-EMD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Observation of whisker growth in various tin plating |
| Sub Title (in English) | |
| Keyword(1) | Conector |
| Keyword(2) | Tin |
| Keyword(3) | Plate |
| Keyword(4) | Whisker |
| Keyword(5) | |
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| Keyword(8) | |
| 1st Author's Name | Yuki Wada |
| 1st Author's Affiliation | Mie University (Mie Univ.) |
| 2nd Author's Name | Kazuo Iida |
| 2nd Author's Affiliation | Mie University (Mie Univ.) |
| 3rd Author's Name | Takafumi Akashi |
| 3rd Author's Affiliation | ASAHI PLATING Co.,Ltd. (ASAHI PLATING) |
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| Speaker | Author-1 |
| Date Time | 2017-03-03 14:45:00 |
| Presentation Time | 15 minutes |
| Registration for | EMD |
| Paper # | EMD2016-105 |
| Volume (vol) | vol.116 |
| Number (no) | no.492 |
| Page | pp.25-28 |
| #Pages | 4 |
| Date of Issue | 2017-02-24 (EMD) |
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