IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2017-05-27 15:15
Sub-Stroke Method Using Arc Pattern for Examinee Authentication on e-Testing
Taisuke Kawamata, Takatoshi Ishii, Takako Akakura (TUS) ET2017-9
Abstract (in Japanese) (See Japanese page) 
(in English) On e-Testing, it is necessary to prevent spoofng to ensure fairness. There are researches that the examinee authentication method to prevent the spoofing using writing data taken by pen tablet. In these researches, a method with sub-stroke was proposed. This method is independent on the form of the characters and it means that the examinee can be authenticate on the short-answer examination. However, the accuracy of sub-stroke method is a lack of accuracy in practical situations. In this paper, we focus on the angular features called arc pattern.
Keyword (in Japanese) (See Japanese page) 
(in English) e-Testing / Examinee authentication / Handwriting character / Sub-stroke / Arc pattern / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 65, ET2017-9, pp. 47-50, May 2017.
Paper # ET2017-9 
Date of Issue 2017-05-20 (ET) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ET2017-9

Conference Information
Committee ET  
Conference Date 2017-05-27 - 2017-05-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Soka Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Collaborative Support, etc. 
Paper Information
Registration To ET 
Conference Code 2017-05-ET 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Sub-Stroke Method Using Arc Pattern for Examinee Authentication on e-Testing 
Sub Title (in English)  
Keyword(1) e-Testing  
Keyword(2) Examinee authentication  
Keyword(3) Handwriting character  
Keyword(4) Sub-stroke  
Keyword(5) Arc pattern  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Taisuke Kawamata  
1st Author's Affiliation Tokyo University of Science (TUS)
2nd Author's Name Takatoshi Ishii  
2nd Author's Affiliation Tokyo University of Science (TUS)
3rd Author's Name Takako Akakura  
3rd Author's Affiliation Tokyo University of Science (TUS)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2017-05-27 15:15:00 
Presentation Time 25 minutes 
Registration for ET 
Paper # ET2017-9 
Volume (vol) vol.117 
Number (no) no.65 
Page pp.47-50 
#Pages
Date of Issue 2017-05-20 (ET) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan