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| Presentation | 2018-02-20 14:25 A Golden-Free Hardware Trojan Detection Technique Considering Intra-Die Variation Fakir Sharif Hossain, Tomokazu Yoneda, Michihiro Shintani, Michiko Inoue (NAIST), Alex Orailoglu (Univ. of California, San Diego)  DC2017-84 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | High detection sensitivity in the presence of process variation is a key challenge for hardware Trojan detection through side channel analysis. In this work, we present an efficient Trojan detection approach in the presence of elevated process variations. The detection sensitivity is sharpened by 1) comparing power levels from neighboring regions within the same chip so that the two measured values exhibit a common trend in terms of process variation, and 2) generating test patterns that toggle each cell multiple times to increase Trojan activation probability. Detection sensitivity is analyzed and its effectiveness demonstrated by means of RPD (relative power difference). We evaluate our approach on ISCAS?89 and ITC?99 benchmarks and the AES-128 circuit for both combinational and sequential type Trojans. High detection sensitivity is demonstrated by analysis on RPD under a variety of process variation levels and experiments for Trojan inserted circuits. |
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| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Hardware Trojan / Detection sensitivity / Power based Side-channel / Spatial correlation / Process Variations / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 117, no. 444, DC2017-84, pp. 43-48, Feb. 2018. | |
| Paper # | DC2017-84 | |
| Date of Issue | 2018-02-13 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2017-84 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2018-02-20 - 2018-02-20 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2018-02-DC |
| Language | English |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Golden-Free Hardware Trojan Detection Technique Considering Intra-Die Variation |
| Sub Title (in English) | |
| Keyword(1) | Hardware Trojan |
| Keyword(2) | Detection sensitivity |
| Keyword(3) | Power based Side-channel |
| Keyword(4) | Spatial correlation |
| Keyword(5) | Process Variations |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Fakir Sharif Hossain |
| 1st Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 2nd Author's Name | Tomokazu Yoneda |
| 2nd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 3rd Author's Name | Michihiro Shintani |
| 3rd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 4th Author's Name | Michiko Inoue |
| 4th Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 5th Author's Name | Alex Orailoglu |
| 5th Author's Affiliation | University of California, San Diego (Univ. of California, San Diego) |
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| Speaker | Author-1 |
| Date Time | 2018-02-20 14:25:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2017-84 |
| Volume (vol) | vol.117 |
| Number (no) | no.444 |
| Page | pp.43-48 |
| #Pages | 6 |
| Date of Issue | 2018-02-13 (DC) |
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