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| Presentation | 2018-02-20 15:30 Investigation of a Measurement Method of Characteristic Variations in the FPGA Considering an LUT Structure Kouhei Satou, Yukiya Miura (Tokyo Metropolitan Univ.)  DC2017-86 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | FPGAs (Field Programmable Gate Arrays) are integrated circuits that can implement arbitrary logic functions by reconfiguration. In recent years, system development using FPGAs is increasing due to advantages such as shortening a development period and reducing a development cost using FPGAs. As device size of a semiconductors is shrinking, influence of characteristic variations and degradations of FPGA chips is becoming a serious problem. Therefore, in order to implement highly reliable digital systems using FPGAs, it is necessary to consider influence of characteristic variations and degradations. In this research, characteristic variations are measured by implementing ring oscillators (ROs) at several locations on the FPGA chip as with the LSI. After that, an oscillation frequency is measured. In the case of FPGAs, logic functions are implemented using LUTs (Look-Up Tables).Even with the same logic function, the LUT has many implementation methods. Oscillation frequencies were measured by several implementations, and features of each circuit and their usage were considered. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | FPGA / Ring Oscillator / Oscillating frequency / Variation / Characteristics / LUT / / | |
| Reference Info. | IEICE Tech. Rep., vol. 117, no. 444, DC2017-86, pp. 55-60, Feb. 2018. | |
| Paper # | DC2017-86 | |
| Date of Issue | 2018-02-13 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2017-86 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2018-02-20 - 2018-02-20 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2018-02-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Investigation of a Measurement Method of Characteristic Variations in the FPGA Considering an LUT Structure |
| Sub Title (in English) | |
| Keyword(1) | FPGA |
| Keyword(2) | Ring Oscillator |
| Keyword(3) | Oscillating frequency |
| Keyword(4) | Variation |
| Keyword(5) | Characteristics |
| Keyword(6) | LUT |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Kouhei Satou |
| 1st Author's Affiliation | Tokyo Metropolitan University (Tokyo Metropolitan Univ.) |
| 2nd Author's Name | Yukiya Miura |
| 2nd Author's Affiliation | Tokyo Metropolitan University (Tokyo Metropolitan Univ.) |
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| Speaker | Author-1 |
| Date Time | 2018-02-20 15:30:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2017-86 |
| Volume (vol) | vol.117 |
| Number (no) | no.444 |
| Page | pp.55-60 |
| #Pages | 6 |
| Date of Issue | 2018-02-13 (DC) |
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