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Paper Abstract and Keywords
Presentation 2018-04-19 13:55
Four-terminal measurement of organic transistors fabricated by reverse offset printing
Gaku Tsuburaoka, Hiroyuki Matsui, Yasunori Takeda (Yamagata Univ.), Tomoko Okamoto, Kousuke Tanabe (DIC Corp.), Shizuo Tokito (Yamagata Univ.) ED2018-2 Link to ES Tech. Rep. Archives: ED2018-2
Abstract (in Japanese) (See Japanese page) 
(in English) Printing high resolution electrodes is an important technology for realizing the high integration of sensing devices and organic radio-frequency tags as well as for further improving the performance of organic transistors. Reverse offset printing method can form fine patterns of functional materials such as silver nanoparticles with a submicrometer line spacing at room temperature. As a method for forming the electrodes of organic transistors, it is possible to shorten the channel length by using the reverse offset printing method capable of high resolution printing. It enables high integration and high-speed operation of transistors. However, it is known that, as the channel length is shortened, the contact resistance at the electrode/semiconductor interface greatly affects the total resistance of devices and the mobility decreases. Transfer line method (TLM) is widely used as a method to estimate the magnitude of the contact resistance. However, resistance values can not be estimated accurately when the variation in transistor characteristics is large. In this research, the contact resistance and channel resistance were analyzed using four-terminal measurement which is one of the methods of estimating the contact resistance. It was found that the crystallinity of the channel material remarkably varies, depending on the conditions for adding the polymer material to semiconductor. In addition, correlation between the carrier injection property and the energy level of the electrodes was observed. The application of four-terminal measurement to printed devices in this research can be expected to be a major guideline for improving the performance of organic transistors.
Keyword (in Japanese) (See Japanese page) 
(in English) reverse offset printing / organic transistor / four-terminal measurement / contact resistance / / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 9, ED2018-2, pp. 5-8, April 2018.
Paper # ED2018-2 
Date of Issue 2018-04-12 (ED) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2018-2 Link to ES Tech. Rep. Archives: ED2018-2

Conference Information
Committee ED  
Conference Date 2018-04-19 - 2018-04-20 
Place (in Japanese) (See Japanese page) 
Place (in English)  
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Topics (in English)  
Paper Information
Registration To ED 
Conference Code 2018-04-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Four-terminal measurement of organic transistors fabricated by reverse offset printing 
Sub Title (in English)  
Keyword(1) reverse offset printing  
Keyword(2) organic transistor  
Keyword(3) four-terminal measurement  
Keyword(4) contact resistance  
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1st Author's Name Gaku Tsuburaoka  
1st Author's Affiliation Yamagata University (Yamagata Univ.)
2nd Author's Name Hiroyuki Matsui  
2nd Author's Affiliation Yamagata University (Yamagata Univ.)
3rd Author's Name Yasunori Takeda  
3rd Author's Affiliation Yamagata University (Yamagata Univ.)
4th Author's Name Tomoko Okamoto  
4th Author's Affiliation DIC Corporation (DIC Corp.)
5th Author's Name Kousuke Tanabe  
5th Author's Affiliation DIC Corporation (DIC Corp.)
6th Author's Name Shizuo Tokito  
6th Author's Affiliation Yamagata University (Yamagata Univ.)
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Speaker Author-1 
Date Time 2018-04-19 13:55:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2018-2 
Volume (vol) vol.118 
Number (no) no.9 
Page pp.5-8 
#Pages
Date of Issue 2018-04-12 (ED) 


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