Paper Abstract and Keywords |
Presentation |
2018-05-25 10:55
Fabrication of nanocavity Raman silicon laser on (100) SOI substrate with a 45 degree rotated top Si layer Yukiko Yamauchi (Osaka Pre Univ.), Makoto Okano (AIST), Susumu Noda (Kyoto Univ.), Yasushi Takahashi (Osaka Pre Univ.) LQE2018-14 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We have developed silicon Raman lasers based on a high quality-factor (Q) photonic crystal nanocavity which has a potential for a light source in photonic integrated circuits. This device must be fabricated in the [100] crystal direction of the (100) SOI substrate to enhance the Raman gain, and there was a misalignment of 45-rotational degrees from the [110] crystal direction in which the substrate was easily cleavable. In this study, we fabricated a nanocavity Raman laser on a (100) SOI substrate whose crystal orientation of the top Si layer was rotated by 45 degrees relative to the silicon support wafer. The Q values, which is important for the laser oscillation, are as high as those studied thus far, and the room-temperature continuous-wave laser oscillation is observed at an extremely low threshold less than 1 uW. In this new substrate the cleavage is able to be performed in a direction perpendicular to the longitudinal direction of laser. This result helps realizing the mass production of the silicon Raman nanocavity laser using the CMOS process and integration with other Si photonics devices. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Raman laser / Silicon laser / Photonic crystal / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 118, no. 62, LQE2018-14, pp. 17-20, May 2018. |
Paper # |
LQE2018-14 |
Date of Issue |
2018-05-17 (LQE) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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LQE2018-14 |
Conference Information |
Committee |
LQE LSJ |
Conference Date |
2018-05-24 - 2018-05-25 |
Place (in Japanese) |
(See Japanese page) |
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Paper Information |
Registration To |
LQE |
Conference Code |
2018-05-LQE-LSJ |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Fabrication of nanocavity Raman silicon laser on (100) SOI substrate with a 45 degree rotated top Si layer |
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Raman laser |
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Silicon laser |
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Photonic crystal |
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1st Author's Name |
Yukiko Yamauchi |
1st Author's Affiliation |
Osaka Prefecture University (Osaka Pre Univ.) |
2nd Author's Name |
Makoto Okano |
2nd Author's Affiliation |
National Institute of Advanced Industrial Science and Technology (AIST) |
3rd Author's Name |
Susumu Noda |
3rd Author's Affiliation |
Kyoto University (Kyoto Univ.) |
4th Author's Name |
Yasushi Takahashi |
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Osaka Prefecture University (Osaka Pre Univ.) |
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Speaker |
Author-1 |
Date Time |
2018-05-25 10:55:00 |
Presentation Time |
25 minutes |
Registration for |
LQE |
Paper # |
LQE2018-14 |
Volume (vol) |
vol.118 |
Number (no) |
no.62 |
Page |
pp.17-20 |
#Pages |
4 |
Date of Issue |
2018-05-17 (LQE) |