Paper Abstract and Keywords |
Presentation |
2018-08-09 12:45
Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii (Renesas) SDM2018-47 ICD2018-34 Link to ES Tech. Rep. Archives: SDM2018-47 ICD2018-34 |
Abstract |
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Reference Info. |
IEICE Tech. Rep., vol. 118, no. 173, ICD2018-34, pp. 109-113, Aug. 2018. |
Paper # |
ICD2018-34 |
Date of Issue |
2018-07-31 (SDM, ICD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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SDM2018-47 ICD2018-34 Link to ES Tech. Rep. Archives: SDM2018-47 ICD2018-34 |
Conference Information |
Committee |
SDM ICD ITE-IST |
Conference Date |
2018-08-07 - 2018-08-09 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Hokkaido Univ., Graduate School of IST M Bldg., M151 |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications |
Paper Information |
Registration To |
ICD |
Conference Code |
2018-08-SDM-ICD-IST |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
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(See Japanese page) |
Title (in English) |
Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET |
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1st Author's Name |
Mitsuhiko Igarashi |
1st Author's Affiliation |
Renesas Electronics Corp. (Renesas) |
2nd Author's Name |
Yuuki Uchida |
2nd Author's Affiliation |
Renesas Electronics Corp. (Renesas) |
3rd Author's Name |
Yoshio Takazawa |
3rd Author's Affiliation |
Renesas Electronics Corp. (Renesas) |
4th Author's Name |
Yasumasa Tsukamoto |
4th Author's Affiliation |
Renesas Electronics Corp. (Renesas) |
5th Author's Name |
Koji Shibutani |
5th Author's Affiliation |
Renesas Electronics Corp. (Renesas) |
6th Author's Name |
Koji Nii |
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Renesas Electronics Corp. (Renesas) |
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Speaker |
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Date Time |
2018-08-09 12:45:00 |
Presentation Time |
25 minutes |
Registration for |
ICD |
Paper # |
SDM2018-47, ICD2018-34 |
Volume (vol) |
vol.118 |
Number (no) |
no.172(SDM), no.173(ICD) |
Page |
pp.109-113 |
#Pages |
5 |
Date of Issue |
2018-07-31 (SDM, ICD) |
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