IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2018-11-09 14:25
Characteristics of arc duration at breaking contacts for low DC current with magnetic blow-out effect
Kiyoshi Yoshida, Kenta Mano, Koichiro Sawa (NIT), Kenji Suzuki (Fuji Electric FA Components & Systems) EMD2018-43 Link to ES Tech. Rep. Archives: EMD2018-43
Abstract (in Japanese) (See Japanese page) 
(in English) It is well-known that magnetic blow-out is an very useful method to extinguish quickly arc discharge at interrupting DC load current. Using this method, arc column is pulled out apart from contact gap by Lorentz force and disappears quickly. Therefore, very short contact gap is only needed. However, it is reported that arc duration at small DC current becomes longer than that at larger current.
In this report, we carried out two experiments. The first is about the magnitude of flux density applied and the effect of contact opening speed on arc duration. The second is at the current range of less than 30A the relation between arc duration and closed circuit current is investigated for silver Ag and tungsten W contacts. Consequently, arc duration becomes the minimum value at the current of 10A for Ag and W contacts and magnetic blow-out 10mT. Further the arc duration becomes very long around the current 3A, and in means that the magnetic blow-out is not effective at such low current. On the other hand, with the magnetic blow-out 25mT, the arc duration has the minimum value around 10A, but the difference of arc duration at the range of 1A to 30A is not large and the arc duration is short compared with the case of 10mT. It suggests that the magnetic blow-out is effective at the whole range of tested current.
Keyword (in Japanese) (See Japanese page) 
(in English) Electrical contacts / Arc discharge / Arc duration / Arc energy / Magnetic blow-out / DC interruption / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 290, EMD2018-43, pp. 13-19, Nov. 2018.
Paper # EMD2018-43 
Date of Issue 2018-11-02 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2018-43 Link to ES Tech. Rep. Archives: EMD2018-43

Conference Information
Committee EMD  
Conference Date 2018-11-09 - 2018-11-09 
Place (in Japanese) (See Japanese page) 
Place (in English) The University of Electro-Communications 
Topics (in Japanese) (See Japanese page) 
Topics (in English) International Session IS-EMD2018 
Paper Information
Registration To EMD 
Conference Code 2018-11-EMD 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Characteristics of arc duration at breaking contacts for low DC current with magnetic blow-out effect 
Sub Title (in English)  
Keyword(1) Electrical contacts  
Keyword(2) Arc discharge  
Keyword(3) Arc duration  
Keyword(4) Arc energy  
Keyword(5) Magnetic blow-out  
Keyword(6) DC interruption  
Keyword(7)  
Keyword(8)  
1st Author's Name Kiyoshi Yoshida  
1st Author's Affiliation Nippon Institute of Technology (NIT)
2nd Author's Name Kenta Mano  
2nd Author's Affiliation Nippon Institute of Technology (NIT)
3rd Author's Name Koichiro Sawa  
3rd Author's Affiliation Nippon Institute of Technology (NIT)
4th Author's Name Kenji Suzuki  
4th Author's Affiliation Fuji Electric FA Components & Systems (Fuji Electric FA Components & Systems)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2018-11-09 14:25:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2018-43 
Volume (vol) vol.118 
Number (no) no.290 
Page pp.13-19 
#Pages
Date of Issue 2018-11-02 (EMD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan