IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2018-12-07 14:10
Ultra-long-term Measurement of Aging Degradation on Ring Oscillators by using FPGA and Micro Controller
Hiroki Nakano (KIT), Ryo Kishida (TUS), Jun Furuta, Kazutoshi Kobayashi (KIT) CPM2018-95 ICD2018-56 IE2018-74 Link to ES Tech. Rep. Archives: CPM2018-95 ICD2018-56
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 337, ICD2018-56, pp. 31-36, Dec. 2018.
Paper # ICD2018-56 
Date of Issue 2018-11-28 (CPM, ICD, IE) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPM2018-95 ICD2018-56 IE2018-74 Link to ES Tech. Rep. Archives: CPM2018-95 ICD2018-56

Conference Information
Committee VLD DC CPSY RECONF CPM ICD IE IPSJ-SLDM 
Conference Date 2018-12-05 - 2018-12-07 
Place (in Japanese) (See Japanese page) 
Place (in English) Satellite Campus Hiroshima 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2018 -New Field of VLSI Design- 
Paper Information
Registration To ICD 
Conference Code 2018-12-VLD-DC-CPSY-RECONF-CPM-ICD-IE-SLDM-EMB-ARC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Ultra-long-term Measurement of Aging Degradation on Ring Oscillators by using FPGA and Micro Controller 
Sub Title (in English)  
Keyword(1)  
Keyword(2)  
Keyword(3)  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Hiroki Nakano  
1st Author's Affiliation Kyoto Institute of Technology (KIT)
2nd Author's Name Ryo Kishida  
2nd Author's Affiliation Tokyo University of Science (TUS)
3rd Author's Name Jun Furuta  
3rd Author's Affiliation Kyoto Institute of Technology (KIT)
4th Author's Name Kazutoshi Kobayashi  
4th Author's Affiliation Kyoto Institute of Technology (KIT)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker
Date Time 2018-12-07 14:10:00 
Presentation Time 25 
Registration for ICD 
Paper # CPM2018-95, ICD2018-56, IE2018-74 
Volume (vol) 118 
Number (no) no.336(CPM), no.337(ICD), no.338(IE) 
Page pp.31-36 
#Pages
Date of Issue 2018-11-28 (CPM, ICD, IE) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan