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| Presentation | 2019-01-25 11:00 [Poster Presentation] Improved Flexoelectric Coefficient Measurement by Means of Transmission Ellipsometry Takashi Onishi, Munehiro Kimura (NUT)  EID2018-18 Link to ES Tech. Rep. Archives: EID2018-18 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | In nematic liquid crystal (NLC), the electrical polarization effect which is called flexoelectricity occurs under splay or bend distortion. Up to today, several kinds of measurement methods has been reported. Even when the subject NLC was the same, however, the obtained flexoelectric coefficients and sign was different. In this study, monochromatic ellipsometry was applied to measure the flexoelectric coefficient. The new measurement procedure is for the summation of flexoelectric coefficients under splay ($e_11$) and bend ($e_33$) deformation, i.e. $e_p$ (=$e_11$+$e_33$) and difference $e_n$ (=$e_11$-$e_33$). The optical phase difference $Delta$ through hybrid aligned NLC cell with alignment deformation caused by DC electric field is measured. The NLC cell used possesses planar and hybrid alignment regions. As for estimating $e_p$, the SOITE method which is insensitive to multiple interference and multiple reflection was applied, and for $e_n$, the dependence of the phase difference on the applied electric field at normal incidence was evaluated. It was demonstrated that the cell thickness and the flexoelectric coefficients $e_p$ and $e_n$ can be determined by numerical fitting procedure. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | nematic liquid crystal / flexoelectric effect / ellipsometry / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 118, no. 422, EID2018-18, pp. 117-120, Jan. 2019. | |
| Paper # | EID2018-18 | |
| Date of Issue | 2019-01-17 (EID) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | EID2018-18 Link to ES Tech. Rep. Archives: EID2018-18 |
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| Conference Information | |
| Committee | EID ITE-IDY IEIJ-SSL SID-JC IEE-EDD |
| Conference Date | 2019-01-24 - 2019-01-25 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kagoshima University |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | EID |
| Conference Code | 2019-01-EID-IDY-SSL-JC-EDD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Improved Flexoelectric Coefficient Measurement by Means of Transmission Ellipsometry |
| Sub Title (in English) | |
| Keyword(1) | nematic liquid crystal |
| Keyword(2) | flexoelectric effect |
| Keyword(3) | ellipsometry |
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| 1st Author's Name | Takashi Onishi |
| 1st Author's Affiliation | Nagaoka University of Technology (NUT) |
| 2nd Author's Name | Munehiro Kimura |
| 2nd Author's Affiliation | Nagaoka University of Technology (NUT) |
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| Speaker | Author-1 |
| Date Time | 2019-01-25 11:00:00 |
| Presentation Time | 5 minutes |
| Registration for | EID |
| Paper # | EID2018-18 |
| Volume (vol) | vol.118 |
| Number (no) | no.422 |
| Page | pp.117-120 |
| #Pages | 4 |
| Date of Issue | 2019-01-17 (EID) |
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