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Presentation 2019-01-25 11:00
[Poster Presentation] Improved Flexoelectric Coefficient Measurement by Means of Transmission Ellipsometry
Takashi Onishi, Munehiro Kimura (NUT) EID2018-18 Link to ES Tech. Rep. Archives: EID2018-18
Abstract (in Japanese) (See Japanese page) 
(in English) In nematic liquid crystal (NLC), the electrical polarization effect which is called flexoelectricity occurs under splay or bend distortion. Up to today, several kinds of measurement methods has been reported. Even when the subject NLC was the same, however, the obtained flexoelectric coefficients and sign was different. In this study, monochromatic ellipsometry was applied to measure the flexoelectric coefficient. The new measurement procedure is for the summation of flexoelectric coefficients under splay ($e_11$) and bend ($e_33$) deformation, i.e. $e_p$ (=$e_11$+$e_33$) and difference $e_n$ (=$e_11$-$e_33$). The optical phase difference $Delta$ through hybrid aligned NLC cell with alignment deformation caused by DC electric field is measured. The NLC cell used possesses planar and hybrid alignment regions. As for estimating $e_p$, the SOITE method which is insensitive to multiple interference and multiple reflection was applied, and for $e_n$, the dependence of the phase difference on the applied electric field at normal incidence was evaluated. It was demonstrated that the cell thickness and the flexoelectric coefficients $e_p$ and $e_n$ can be determined by numerical fitting procedure.
Keyword (in Japanese) (See Japanese page) 
(in English) nematic liquid crystal / flexoelectric effect / ellipsometry / / / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 422, EID2018-18, pp. 117-120, Jan. 2019.
Paper # EID2018-18 
Date of Issue 2019-01-17 (EID) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EID2018-18 Link to ES Tech. Rep. Archives: EID2018-18

Conference Information
Conference Date 2019-01-24 - 2019-01-25 
Place (in Japanese) (See Japanese page) 
Place (in English) Kagoshima University 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EID 
Conference Code 2019-01-EID-IDY-SSL-JC-EDD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Improved Flexoelectric Coefficient Measurement by Means of Transmission Ellipsometry 
Sub Title (in English)  
Keyword(1) nematic liquid crystal  
Keyword(2) flexoelectric effect  
Keyword(3) ellipsometry  
1st Author's Name Takashi Onishi  
1st Author's Affiliation Nagaoka University of Technology (NUT)
2nd Author's Name Munehiro Kimura  
2nd Author's Affiliation Nagaoka University of Technology (NUT)
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Speaker Author-1 
Date Time 2019-01-25 11:00:00 
Presentation Time 5 minutes 
Registration for EID 
Paper # EID2018-18 
Volume (vol) vol.118 
Number (no) no.422 
Page pp.117-120 
Date of Issue 2019-01-17 (EID) 

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