Paper Abstract and Keywords |
Presentation |
2019-01-29 10:20
[Invited Talk]
Direct relationship between sub-60 mV/dec subthreshold swing and internal potential instability in MOSFET externally connected to ferroelectric capacitor Li Xiuyan, Akira Toriumi (Univ. of Tokyo) SDM2018-83 Link to ES Tech. Rep. Archives: SDM2018-83 |
Abstract |
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(See Japanese page) |
(in English) |
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Reference Info. |
IEICE Tech. Rep., vol. 118, no. 429, SDM2018-83, pp. 9-12, Jan. 2019. |
Paper # |
SDM2018-83 |
Date of Issue |
2019-01-22 (SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SDM2018-83 Link to ES Tech. Rep. Archives: SDM2018-83 |
Conference Information |
Committee |
SDM |
Conference Date |
2019-01-29 - 2019-01-29 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
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Registration To |
SDM |
Conference Code |
2019-01-SDM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
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Title (in English) |
Direct relationship between sub-60 mV/dec subthreshold swing and internal potential instability in MOSFET externally connected to ferroelectric capacitor |
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1st Author's Name |
Li Xiuyan |
1st Author's Affiliation |
University of Tokyo (Univ. of Tokyo) |
2nd Author's Name |
Akira Toriumi |
2nd Author's Affiliation |
University of Tokyo (Univ. of Tokyo) |
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Speaker |
Author-1 |
Date Time |
2019-01-29 10:20:00 |
Presentation Time |
25 minutes |
Registration for |
SDM |
Paper # |
SDM2018-83 |
Volume (vol) |
vol.118 |
Number (no) |
no.429 |
Page |
pp.9-12 |
#Pages |
4 |
Date of Issue |
2019-01-22 (SDM) |