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| Presentation | 2019-02-27 09:50 A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ)  DC2018-73 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of capture-unsafe test vectors and unsafe faults in an initial test set. Conventional low power oriented X identification methods identified X's such that the number of detected faults for each test vector was almost same. The quality of low power oriented don't care X filling methods depends on the test cube set generated after the application of X-identification. Therefore, it is important to further consider low power consumption of an initial test set at X-identification stage. In this paper, we analyze fault propagation paths for faults in transitive fan-in regions of unsafe faults using randomly generated capture-safe test vectors and propose a low power oriented X identification method mimicking the fault propagation paths under the power consumption constraint. Experimental results for ISCAS'89 and ITC’99 benchmark circuits show that our proposed method reduced the numbers of capture-unsafe test vectors and unsafe fault compared with a conventional low power oriented X-identification method. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | capture-safe test vectors / don’t care identification / fault propagation paths / low power testing / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 118, no. 456, DC2018-73, pp. 13-18, Feb. 2019. | |
| Paper # | DC2018-73 | |
| Date of Issue | 2019-02-20 (DC) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2018-73 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2019-02-27 - 2019-02-27 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2019-02-DC |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors |
| Sub Title (in English) | |
| Keyword(1) | capture-safe test vectors |
| Keyword(2) | don’t care identification |
| Keyword(3) | fault propagation paths |
| Keyword(4) | low power testing |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Kenichiro Misawa |
| 1st Author's Affiliation | Nihon University (Nihon Univ) |
| 2nd Author's Name | Toshinori Hosokawa |
| 2nd Author's Affiliation | Nihon University (Nihon Univ) |
| 3rd Author's Name | Hiroshi Yamazaki |
| 3rd Author's Affiliation | Nihon University (Nihon Univ) |
| 4th Author's Name | Masayoshi Yoshimura |
| 4th Author's Affiliation | Kyouto Sangyo University (Kyouto Sangyo Univ) |
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| Speaker | 1 |
| Date Time | 2019-02-27 09:50:00 |
| Presentation Time | 25 |
| Registration for | DC |
| Paper # | DC2018-73 |
| Volume (vol) | 118 |
| Number (no) | no.456 |
| Page | pp.13-18 |
| #Pages | 6 |
| Date of Issue | 2019-02-20 (DC) |
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