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Paper Abstract and Keywords
Presentation 2019-02-27 09:50
A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73
Abstract (in Japanese) (See Japanese page) 
(in English) Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of capture-unsafe test vectors and unsafe faults in an initial test set. Conventional low power oriented X identification methods identified X's such that the number of detected faults for each test vector was almost same. The quality of low power oriented don't care X filling methods depends on the test cube set generated after the application of X-identification. Therefore, it is important to further consider low power consumption of an initial test set at X-identification stage. In this paper, we analyze fault propagation paths for faults in transitive fan-in regions of unsafe faults using randomly generated capture-safe test vectors and propose a low power oriented X identification method mimicking the fault propagation paths under the power consumption constraint. Experimental results for ISCAS'89 and ITC’99 benchmark circuits show that our proposed method reduced the numbers of capture-unsafe test vectors and unsafe fault compared with a conventional low power oriented X-identification method.
Keyword (in Japanese) (See Japanese page) 
(in English) capture-safe test vectors / don’t care identification / fault propagation paths / low power testing / / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 456, DC2018-73, pp. 13-18, Feb. 2019.
Paper # DC2018-73 
Date of Issue 2019-02-20 (DC) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2019-02-27 - 2019-02-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Design and Test, etc. 
Paper Information
Registration To DC 
Conference Code 2019-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors 
Sub Title (in English)  
Keyword(1) capture-safe test vectors  
Keyword(2) don’t care identification  
Keyword(3) fault propagation paths  
Keyword(4) low power testing  
1st Author's Name Kenichiro Misawa  
1st Author's Affiliation Nihon University (Nihon Univ)
2nd Author's Name Toshinori Hosokawa  
2nd Author's Affiliation Nihon University (Nihon Univ)
3rd Author's Name Hiroshi Yamazaki  
3rd Author's Affiliation Nihon University (Nihon Univ)
4th Author's Name Masayoshi Yoshimura  
4th Author's Affiliation Kyouto Sangyo University (Kyouto Sangyo Univ)
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Date Time 2019-02-27 09:50:00 
Presentation Time 25 
Registration for DC 
Paper # DC2018-73 
Volume (vol) 118 
Number (no) no.456 
Page pp.13-18 
Date of Issue 2019-02-20 (DC) 

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