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Paper Abstract and Keywords
Presentation 2019-02-27 15:10
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines
Yuki Maeda, Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue (Hiroshima City Univ.) DC2018-81
Abstract (in Japanese) (See Japanese page) 
(in English) Stochastic Computing (SC) has attractive characteristics, compared with deterministic (or general binary) computing, such as smaller area of the implemented circuits, higher fault tolerant, and so on. This study focuses on the transient fault tolerance of SC circuits with linear finite state machines (linear FSMs), and proposes a design of linear FSM-based SC circuits by means of encoding the states with stochastic numbers (SNs) to improve the transient fault tolerability. Moreover, we propose a design of SN-encoding SC circuits with approximate state transition so as to reduce the area overhead of the SN-encoding. These two designs are modeled as Markov chains to clarify their behaviors when any transient fault occurs. Experimental results clarify the error tolerability of SC circuits designed by the proposed methods. From these results, we can see that the SC circuit implementing a hyperbolic tangent function (tanh) has high fault tolerability.
Keyword (in Japanese) (See Japanese page) 
(in English) Approximate computing / Markov chain / FF flipping fault / soft error / calculation error / / /  
Reference Info. IEICE Tech. Rep., vol. 118, no. 456, DC2018-81, pp. 61-66, Feb. 2019.
Paper # DC2018-81 
Date of Issue 2019-02-20 (DC) 
ISSN Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2019-02-27 - 2019-02-27 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Design and Test, etc. 
Paper Information
Registration To DC 
Conference Code 2019-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines 
Sub Title (in English)  
Keyword(1) Approximate computing  
Keyword(2) Markov chain  
Keyword(3) FF flipping fault  
Keyword(4) soft error  
Keyword(5) calculation error  
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Keyword(7)  
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1st Author's Name Yuki Maeda  
1st Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
2nd Author's Name Hideyuki Ichihara  
2nd Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
3rd Author's Name Tsuyoshi Iwagaki  
3rd Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
4th Author's Name Tomoo Inoue  
4th Author's Affiliation Hiroshima City University (Hiroshima City Univ.)
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Speaker Author-1 
Date Time 2019-02-27 15:10:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2018-81 
Volume (vol) vol.118 
Number (no) no.456 
Page pp.61-66 
#Pages
Date of Issue 2019-02-20 (DC) 


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