Paper Abstract and Keywords |
Presentation |
2019-11-08 14:30
[Invited Talk]
Investigation of TCAD Calibration Methods for Saturation and Tail Current of 6.5kV IGBTs Takeshi Suwa, Shigeaki Hayase (TDSC) SDM2019-78 Link to ES Tech. Rep. Archives: SDM2019-78 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this work we focus on two calibration methods to clarify a key point of TCAD calibration for turn-off waveforms and IV characteristics including the saturation currents of IGBTs at the same time. Simulated results with the method based on adjustments of the surface N+ and P+ depth ratio reproduce measured results of all calibration targets reasonably in terms of time and accuracy. On the other hand, simulated results by mainly calibrating parameters of the velocity saturation model for saturation currents hardly reproduce all calibration targets simultaneously. We explain the reason using the roughly approximated criteria of the dynamic punch-through oscillation and dynamic avalanche. We also analyze the temperature dependence of the tail current briefly which is one of the important design items of IGBTs. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
IGBT / TCAD / calibration / tail current / saturation current / / / |
Reference Info. |
IEICE Tech. Rep., vol. 119, no. 273, SDM2019-78, pp. 49-54, Nov. 2019. |
Paper # |
SDM2019-78 |
Date of Issue |
2019-10-31 (SDM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
SDM2019-78 Link to ES Tech. Rep. Archives: SDM2019-78 |
Conference Information |
Committee |
SDM |
Conference Date |
2019-11-07 - 2019-11-08 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Process, Device, Circuit simulation, etc. |
Paper Information |
Registration To |
SDM |
Conference Code |
2019-11-SDM |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Investigation of TCAD Calibration Methods for Saturation and Tail Current of 6.5kV IGBTs |
Sub Title (in English) |
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Keyword(1) |
IGBT |
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TCAD |
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calibration |
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tail current |
Keyword(5) |
saturation current |
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1st Author's Name |
Takeshi Suwa |
1st Author's Affiliation |
Toshiba Electronic Devices & Storage Corporation (TDSC) |
2nd Author's Name |
Shigeaki Hayase |
2nd Author's Affiliation |
Toshiba Electronic Devices & Storage Corporation (TDSC) |
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Speaker |
Author-1 |
Date Time |
2019-11-08 14:30:00 |
Presentation Time |
60 minutes |
Registration for |
SDM |
Paper # |
SDM2019-78 |
Volume (vol) |
vol.119 |
Number (no) |
no.273 |
Page |
pp.49-54 |
#Pages |
6 |
Date of Issue |
2019-10-31 (SDM) |
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