IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2019-11-08 14:30
[Invited Talk] Investigation of TCAD Calibration Methods for Saturation and Tail Current of 6.5kV IGBTs
Takeshi Suwa, Shigeaki Hayase (TDSC) SDM2019-78 Link to ES Tech. Rep. Archives: SDM2019-78
Abstract (in Japanese) (See Japanese page) 
(in English) In this work we focus on two calibration methods to clarify a key point of TCAD calibration for turn-off waveforms and IV characteristics including the saturation currents of IGBTs at the same time. Simulated results with the method based on adjustments of the surface N+ and P+ depth ratio reproduce measured results of all calibration targets reasonably in terms of time and accuracy. On the other hand, simulated results by mainly calibrating parameters of the velocity saturation model for saturation currents hardly reproduce all calibration targets simultaneously. We explain the reason using the roughly approximated criteria of the dynamic punch-through oscillation and dynamic avalanche. We also analyze the temperature dependence of the tail current briefly which is one of the important design items of IGBTs.
Keyword (in Japanese) (See Japanese page) 
(in English) IGBT / TCAD / calibration / tail current / saturation current / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 273, SDM2019-78, pp. 49-54, Nov. 2019.
Paper # SDM2019-78 
Date of Issue 2019-10-31 (SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2019-78 Link to ES Tech. Rep. Archives: SDM2019-78

Conference Information
Committee SDM  
Conference Date 2019-11-07 - 2019-11-08 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Process, Device, Circuit simulation, etc. 
Paper Information
Registration To SDM 
Conference Code 2019-11-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Investigation of TCAD Calibration Methods for Saturation and Tail Current of 6.5kV IGBTs 
Sub Title (in English)  
Keyword(1) IGBT  
Keyword(2) TCAD  
Keyword(3) calibration  
Keyword(4) tail current  
Keyword(5) saturation current  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Takeshi Suwa  
1st Author's Affiliation Toshiba Electronic Devices & Storage Corporation (TDSC)
2nd Author's Name Shigeaki Hayase  
2nd Author's Affiliation Toshiba Electronic Devices & Storage Corporation (TDSC)
3rd Author's Name  
3rd Author's Affiliation ()
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2019-11-08 14:30:00 
Presentation Time 60 minutes 
Registration for SDM 
Paper # SDM2019-78 
Volume (vol) vol.119 
Number (no) no.273 
Page pp.49-54 
#Pages
Date of Issue 2019-10-31 (SDM) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan