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Presentation 2019-11-22 10:50
Research on imagingtube with high speed electron beam reading
Masato Nakada, Hidenori Mimura, Yoshinori Hatanaka, Toshiaki Masuzawa, Yoichiro Neo (Sizuoka Univ.) ED2019-72 Link to ES Tech. Rep. Archives: ED2019-72
Abstract (in Japanese) (See Japanese page) 
(in English) Since the Fukushima nuclear accident, it has become important to develop imaging sensors that have high environmental resistance under special circumstances. As an example, there is a request for high radiation resistance and high temperature operation for monitoring in nuclear reactors. Semiconductor image sensors such as CCD and CMOS have a defect in the gate oxide film and crystal structure due to the effect of radiation, so it is difficult to capture images for a long time. On the other hand, since the imaging tube uses vacuum electrons with no microstructure, high radiation resistance is expected.
In this study, we propose a high speed electron beam reading that operates by accumulating electrons as image signals. Electrons have a higher mobility than holes, so they are expected to have afterimage suppression and highly efficient carrier collection. To verify the proposed method, we attempted to image by controlling the secondary electron yield on the electron beam incident side of the photoconductive film by controlling the electrode voltage close to the photoconductive film. We evaluated the image changes when the environmental temperature of the tube was changed.
Keyword (in Japanese) (See Japanese page) 
(in English) imaging tube / imaging sensors / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 305, ED2019-72, pp. 51-54, Nov. 2019.
Paper # ED2019-72 
Date of Issue 2019-11-14 (ED) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2019-72 Link to ES Tech. Rep. Archives: ED2019-72

Conference Information
Committee ED  
Conference Date 2019-11-21 - 2019-11-22 
Place (in Japanese) (See Japanese page) 
Place (in English)  
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Paper Information
Registration To ED 
Conference Code 2019-11-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Research on imagingtube with high speed electron beam reading 
Sub Title (in English)  
Keyword(1) imaging tube  
Keyword(2) imaging sensors  
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1st Author's Name Masato Nakada  
1st Author's Affiliation Shizuoka University (Sizuoka Univ.)
2nd Author's Name Hidenori Mimura  
2nd Author's Affiliation Shizuoka University (Sizuoka Univ.)
3rd Author's Name Yoshinori Hatanaka  
3rd Author's Affiliation Shizuoka University (Sizuoka Univ.)
4th Author's Name Toshiaki Masuzawa  
4th Author's Affiliation Shizuoka University (Sizuoka Univ.)
5th Author's Name Yoichiro Neo  
5th Author's Affiliation Shizuoka University (Sizuoka Univ.)
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Speaker Author-1 
Date Time 2019-11-22 10:50:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2019-72 
Volume (vol) vol.119 
Number (no) no.305 
Page pp.51-54 
#Pages
Date of Issue 2019-11-14 (ED) 


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