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Paper Abstract and Keywords
Presentation 2020-01-22 15:25
Increasing Test Variation for C Compilers by Equivalent Mutant Generation
Hiroki Maeda, Nagisa ishiura (Kwansei Gakuin Univ.) VLD2019-61 CPSY2019-59 RECONF2019-51
Abstract (in Japanese) (See Japanese page) 
(in English) This article proposes a method of increasing variation of test programs in automatic testing of C compilers by means of equivalent mutant generation. A mutation-based method, where test programs are generated by mutating existing test programs, has different merits from a grammar-based generation method, especially when seed test programs are properly chosen. One of the challenges for the mutation-based method is that applicable mutations have been limited because the mutations must not induce undefined behavior in test programs. This article introduces new types of mutations by bookkeeping the values of all the variables in seed test programs. Our new mutations generate equivalent test programs from a seed program in a sense that all the variable updates are done with the same values both in the seed and mutated programs. The mutations are based on 1) replacement of types and modifiers of variables, 2) interchange among scalar variables, array elements, and struct members, and 3) nesting statements with conditional and loop constructs. A test system based on the proposed method has detected bugs in GCC-5.5.0 and LLVM/Clang-3.5.2 by test programs which can not be generated by existing methods.
Keyword (in Japanese) (See Japanese page) 
(in English) compiler / automatic testing / equivalent mutant / / / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 371, VLD2019-61, pp. 43-48, Jan. 2020.
Paper # VLD2019-61 
Date of Issue 2020-01-15 (VLD, CPSY, RECONF) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2019-61 CPSY2019-59 RECONF2019-51

Conference Information
Committee IPSJ-SLDM RECONF VLD CPSY IPSJ-ARC  
Conference Date 2020-01-22 - 2020-01-24 
Place (in Japanese) (See Japanese page) 
Place (in English) Raiosha, Hiyoshi Campus, Keio University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) FPGA Applications, etc. 
Paper Information
Registration To VLD 
Conference Code 2020-01-SLDM-RECONF-VLD-CPSY-ARC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Increasing Test Variation for C Compilers by Equivalent Mutant Generation 
Sub Title (in English)  
Keyword(1) compiler  
Keyword(2) automatic testing  
Keyword(3) equivalent mutant  
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1st Author's Name Hiroki Maeda  
1st Author's Affiliation Kwansei Gakuin University (Kwansei Gakuin Univ.)
2nd Author's Name Nagisa ishiura  
2nd Author's Affiliation Kwansei Gakuin University (Kwansei Gakuin Univ.)
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Speaker Author-1 
Date Time 2020-01-22 15:25:00 
Presentation Time 25 minutes 
Registration for VLD 
Paper # VLD2019-61, CPSY2019-59, RECONF2019-51 
Volume (vol) vol.119 
Number (no) no.371(VLD), no.372(CPSY), no.373(RECONF) 
Page pp.43-48 
#Pages
Date of Issue 2020-01-15 (VLD, CPSY, RECONF) 


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