Paper Abstract and Keywords |
Presentation |
2020-01-22 15:25
Increasing Test Variation for C Compilers by Equivalent Mutant Generation Hiroki Maeda, Nagisa ishiura (Kwansei Gakuin Univ.) VLD2019-61 CPSY2019-59 RECONF2019-51 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This article proposes a method of increasing variation of test programs in automatic testing of C compilers by means of equivalent mutant generation. A mutation-based method, where test programs are generated by mutating existing test programs, has different merits from a grammar-based generation method, especially when seed test programs are properly chosen. One of the challenges for the mutation-based method is that applicable mutations have been limited because the mutations must not induce undefined behavior in test programs. This article introduces new types of mutations by bookkeeping the values of all the variables in seed test programs. Our new mutations generate equivalent test programs from a seed program in a sense that all the variable updates are done with the same values both in the seed and mutated programs. The mutations are based on 1) replacement of types and modifiers of variables, 2) interchange among scalar variables, array elements, and struct members, and 3) nesting statements with conditional and loop constructs. A test system based on the proposed method has detected bugs in GCC-5.5.0 and LLVM/Clang-3.5.2 by test programs which can not be generated by existing methods. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
compiler / automatic testing / equivalent mutant / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 119, no. 371, VLD2019-61, pp. 43-48, Jan. 2020. |
Paper # |
VLD2019-61 |
Date of Issue |
2020-01-15 (VLD, CPSY, RECONF) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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VLD2019-61 CPSY2019-59 RECONF2019-51 |
Conference Information |
Committee |
IPSJ-SLDM RECONF VLD CPSY IPSJ-ARC |
Conference Date |
2020-01-22 - 2020-01-24 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Raiosha, Hiyoshi Campus, Keio University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
FPGA Applications, etc. |
Paper Information |
Registration To |
VLD |
Conference Code |
2020-01-SLDM-RECONF-VLD-CPSY-ARC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
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(See Japanese page) |
Title (in English) |
Increasing Test Variation for C Compilers by Equivalent Mutant Generation |
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compiler |
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automatic testing |
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equivalent mutant |
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1st Author's Name |
Hiroki Maeda |
1st Author's Affiliation |
Kwansei Gakuin University (Kwansei Gakuin Univ.) |
2nd Author's Name |
Nagisa ishiura |
2nd Author's Affiliation |
Kwansei Gakuin University (Kwansei Gakuin Univ.) |
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Speaker |
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Date Time |
2020-01-22 15:25:00 |
Presentation Time |
25 minutes |
Registration for |
VLD |
Paper # |
VLD2019-61, CPSY2019-59, RECONF2019-51 |
Volume (vol) |
vol.119 |
Number (no) |
no.371(VLD), no.372(CPSY), no.373(RECONF) |
Page |
pp.43-48 |
#Pages |
6 |
Date of Issue |
2020-01-15 (VLD, CPSY, RECONF) |
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