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Paper Abstract and Keywords
Presentation 2020-01-30 13:10
[Invited Talk] A Proposal of MOS LSI Analog Sign-Off Verification.
Kimihiro Ogawa (Success Inc.) CAS2019-70 ICTSSL2019-39
Abstract (in Japanese) (See Japanese page) 
(in English) In analog MOS circuit sign-off verification to guarantee design yield, it is well known that analog oriented methodology is mandatory, different from digital sign-off. Especially, Fast/Slow metric for digital considering only Max/Min of Ids is not good enough for analog. However, in Japanese analog design, the traditional sign-off methodology based on digital is still widely used, therefore I guess analog sign-off sometimes has some problems such as over-spec or under-spec. In this presentation, I will show the drawbacks of digital sign-off and the recommended analog sign-off. I hope this will make a turning point for Japanese analog designers.
Keyword (in Japanese) (See Japanese page) 
(in English) MOS Analog Circuit / Sign-off / Fast/Slow Corner / Design Yield / / / /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 400, CAS2019-70, pp. 35-41, Jan. 2020.
Paper # CAS2019-70 
Date of Issue 2020-01-23 (CAS, ICTSSL) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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Conference Information
Committee ICTSSL CAS  
Conference Date 2020-01-30 - 2020-01-31 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
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Paper Information
Registration To CAS 
Conference Code 2020-01-ICTSSL-CAS 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Proposal of MOS LSI Analog Sign-Off Verification. 
Sub Title (in English)  
Keyword(1) MOS Analog Circuit  
Keyword(2) Sign-off  
Keyword(3) Fast/Slow Corner  
Keyword(4) Design Yield  
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1st Author's Name Kimihiro Ogawa  
1st Author's Affiliation Success International Inc. (Success Inc.)
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Speaker Author-1 
Date Time 2020-01-30 13:10:00 
Presentation Time 60 minutes 
Registration for CAS 
Paper # CAS2019-70, ICTSSL2019-39 
Volume (vol) vol.119 
Number (no) no.400(CAS), no.401(ICTSSL) 
Page pp.35-41 
#Pages
Date of Issue 2020-01-23 (CAS, ICTSSL) 


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