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| Presentation | 2020-01-31 14:10 [Special Talk] An Accurate and Fast Permittivity Measurement System for Terahertz imaging Teruo Jyo, Hiroshi Hamada, Hideaki Matsuzaki, Hideyuki Nosaka (NTT)  ED2019-100 MW2019-134 Link to ES Tech. Rep. Archives: ED2019-100 MW2019-134 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | THz permittivity imaging using phase information is an effective solution for detecting non-metallic matter and is expected to be applied to non-destructive inspection such as food inspection. However, conventional permittivity measurement systems have problems with low accuracy and slow speed. In this study, we propose a high-accuracy and high-speed permittivity measurement system that demonstrated the measurement time can be shortened to 1/200 while maintaining high accuracy. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Terahertz / imaging / permittivity measurement / phase noise / self-heterodyne / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 119, no. 409, MW2019-134, pp. 35-40, Jan. 2020. | |
| Paper # | MW2019-134 | |
| Date of Issue | 2020-01-24 (ED, MW) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ED2019-100 MW2019-134 Link to ES Tech. Rep. Archives: ED2019-100 MW2019-134 |
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| Conference Information | |
| Committee | ED MW |
| Conference Date | 2020-01-31 - 2020-01-31 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Compound semiconductor, High speed and High frequency devices/Microwave technologies |
| Paper Information | |
| Registration To | MW |
| Conference Code | 2020-01-ED-MW |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Accurate and Fast Permittivity Measurement System for Terahertz imaging |
| Sub Title (in English) | |
| Keyword(1) | Terahertz |
| Keyword(2) | imaging |
| Keyword(3) | permittivity measurement |
| Keyword(4) | phase noise |
| Keyword(5) | self-heterodyne |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Teruo Jyo |
| 1st Author's Affiliation | NIPPON TELEGRAPH AND TELEPHONE CORPORATION (NTT) |
| 2nd Author's Name | Hiroshi Hamada |
| 2nd Author's Affiliation | NIPPON TELEGRAPH AND TELEPHONE CORPORATION (NTT) |
| 3rd Author's Name | Hideaki Matsuzaki |
| 3rd Author's Affiliation | NIPPON TELEGRAPH AND TELEPHONE CORPORATION (NTT) |
| 4th Author's Name | Hideyuki Nosaka |
| 4th Author's Affiliation | NIPPON TELEGRAPH AND TELEPHONE CORPORATION (NTT) |
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| Speaker | Author-1 |
| Date Time | 2020-01-31 14:10:00 |
| Presentation Time | 25 minutes |
| Registration for | MW |
| Paper # | ED2019-100, MW2019-134 |
| Volume (vol) | vol.119 |
| Number (no) | no.408(ED), no.409(MW) |
| Page | pp.35-40 |
| #Pages | 6 |
| Date of Issue | 2020-01-24 (ED, MW) |
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