Paper Abstract and Keywords |
Presentation |
2020-03-06 16:05
Production of Automatic Contact Resistance Measurement System for Electrical Contacts Tatsuya Onodera, Sho Kashiwabara, Koichiro Sawa, Kiyoshi Yoshida (NIT) EMD2019-69 Link to ES Tech. Rep. Archives: EMD2019-69 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this study, we constructed an automatic measurement system for the contact resistance of electrical contacts. This system used measurement control software LabVIEW (National Instruments). In the experiments, the contact resistance of two types of electrical contacts mounted on the electromagnetic contactor was measured up to one million operations. The electromagnetic contactor has a total of four electrical contacts, two single contacts and two twin contacts. The experimental conditions were as follows: the power supply voltage was constant at 5 V, and the current was set at 10 mA. The open and close operation were set to 3 Hz, and the contact resistance was measured 10 times every 2000 times operation, and the average value was obtained.
As a result of the experiment, it was confirmed that the contact resistance of the three contacts fluctuated greatly up to around 100,000 switching. However, the contact resistance thereafter was low and stable. Such a large change in the contact resistance in early stage of the operation was confirmed by automatic measurement. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Automatic Measurement / LabVIEW / Electrical Contact / Electromagnetic Contactor / Single Contact / Twin Contact / Contact Resistance / |
Reference Info. |
IEICE Tech. Rep., vol. 119, no. 466, EMD2019-69, pp. 51-56, March 2020. |
Paper # |
EMD2019-69 |
Date of Issue |
2020-02-28 (EMD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
EMD2019-69 Link to ES Tech. Rep. Archives: EMD2019-69 |
Conference Information |
Committee |
EMD |
Conference Date |
2020-03-06 - 2020-03-06 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
CHIBA Institute of Technology Tsudanuma Campus |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Short NOTE |
Paper Information |
Registration To |
EMD |
Conference Code |
2020-03-EMD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Production of Automatic Contact Resistance Measurement System for Electrical Contacts |
Sub Title (in English) |
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Keyword(1) |
Automatic Measurement |
Keyword(2) |
LabVIEW |
Keyword(3) |
Electrical Contact |
Keyword(4) |
Electromagnetic Contactor |
Keyword(5) |
Single Contact |
Keyword(6) |
Twin Contact |
Keyword(7) |
Contact Resistance |
Keyword(8) |
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1st Author's Name |
Tatsuya Onodera |
1st Author's Affiliation |
Nippon Institute of Technology (NIT) |
2nd Author's Name |
Sho Kashiwabara |
2nd Author's Affiliation |
Nippon Institute of Technology (NIT) |
3rd Author's Name |
Koichiro Sawa |
3rd Author's Affiliation |
Nippon Institute of Technology (NIT) |
4th Author's Name |
Kiyoshi Yoshida |
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Nippon Institute of Technology (NIT) |
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Speaker |
Author-1 |
Date Time |
2020-03-06 16:05:00 |
Presentation Time |
15 minutes |
Registration for |
EMD |
Paper # |
EMD2019-69 |
Volume (vol) |
vol.119 |
Number (no) |
no.466 |
Page |
pp.51-56 |
#Pages |
6 |
Date of Issue |
2020-02-28 (EMD) |
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