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Paper Abstract and Keywords
Presentation 2020-03-06 16:05
Production of Automatic Contact Resistance Measurement System for Electrical Contacts
Tatsuya Onodera, Sho Kashiwabara, Koichiro Sawa, Kiyoshi Yoshida (NIT) EMD2019-69 Link to ES Tech. Rep. Archives: EMD2019-69
Abstract (in Japanese) (See Japanese page) 
(in English) In this study, we constructed an automatic measurement system for the contact resistance of electrical contacts. This system used measurement control software LabVIEW (National Instruments). In the experiments, the contact resistance of two types of electrical contacts mounted on the electromagnetic contactor was measured up to one million operations. The electromagnetic contactor has a total of four electrical contacts, two single contacts and two twin contacts. The experimental conditions were as follows: the power supply voltage was constant at 5 V, and the current was set at 10 mA. The open and close operation were set to 3 Hz, and the contact resistance was measured 10 times every 2000 times operation, and the average value was obtained.
As a result of the experiment, it was confirmed that the contact resistance of the three contacts fluctuated greatly up to around 100,000 switching. However, the contact resistance thereafter was low and stable. Such a large change in the contact resistance in early stage of the operation was confirmed by automatic measurement.
Keyword (in Japanese) (See Japanese page) 
(in English) Automatic Measurement / LabVIEW / Electrical Contact / Electromagnetic Contactor / Single Contact / Twin Contact / Contact Resistance /  
Reference Info. IEICE Tech. Rep., vol. 119, no. 466, EMD2019-69, pp. 51-56, March 2020.
Paper # EMD2019-69 
Date of Issue 2020-02-28 (EMD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2019-69 Link to ES Tech. Rep. Archives: EMD2019-69

Conference Information
Committee EMD  
Conference Date 2020-03-06 - 2020-03-06 
Place (in Japanese) (See Japanese page) 
Place (in English) CHIBA Institute of Technology Tsudanuma Campus 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Short NOTE 
Paper Information
Registration To EMD 
Conference Code 2020-03-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Production of Automatic Contact Resistance Measurement System for Electrical Contacts 
Sub Title (in English)  
Keyword(1) Automatic Measurement  
Keyword(2) LabVIEW  
Keyword(3) Electrical Contact  
Keyword(4) Electromagnetic Contactor  
Keyword(5) Single Contact  
Keyword(6) Twin Contact  
Keyword(7) Contact Resistance  
Keyword(8)  
1st Author's Name Tatsuya Onodera  
1st Author's Affiliation Nippon Institute of Technology (NIT)
2nd Author's Name Sho Kashiwabara  
2nd Author's Affiliation Nippon Institute of Technology (NIT)
3rd Author's Name Koichiro Sawa  
3rd Author's Affiliation Nippon Institute of Technology (NIT)
4th Author's Name Kiyoshi Yoshida  
4th Author's Affiliation Nippon Institute of Technology (NIT)
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Speaker Author-1 
Date Time 2020-03-06 16:05:00 
Presentation Time 15 minutes 
Registration for EMD 
Paper # EMD2019-69 
Volume (vol) vol.119 
Number (no) no.466 
Page pp.51-56 
#Pages
Date of Issue 2020-02-28 (EMD) 


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