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| Presentation | 2020-03-07 10:55 Causes of Entropy Loss on Non-IID PUFs and their Entropy Estimations (2) Mitsuru Shiozaki (Ritsumeikan Univ.), Yohei Hori (AIST), Shunsuke Okura, Masayoshi Shirahata, Takeshi Fujino (Ritsumeikan Univ.)  VLD2019-139 HWS2019-112 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Recently, evaluation items and evaluation schemes of Physically Unclonable Functions (PUFs) are discussed in international standardization activities. When PUFs are applied to applications such as key generation, min-entropy estimation is essential. However, few studies have focused on non-independent and identically distributed (IID) PUFs. In this paper, we propose a method to estimate the entropy of the multiple sources, which is one of the entropy-loss causes and makes responses non-IID. The min-entropy of our CMOS image sensor with a PUF (CIS PUF) is estimated as a case study. In addition, when the pairwise comparison is applied to our CIS PUF, we discuss how much entropy our CIS PUF has. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | Physically Unclonable Function (PUF) / Min-Entropy / CMOS image sensor with a PUF (CIS PUF) / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 119, no. 444, HWS2019-112, pp. 263-268, March 2020. | |
| Paper # | HWS2019-112 | |
| Date of Issue | 2020-02-26 (VLD, HWS) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2019-139 HWS2019-112 |
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| Conference Information | |
| Committee | HWS VLD |
| Conference Date | 2020-03-04 - 2020-03-07 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Okinawa Ken Seinen Kaikan |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Technology for System-on-Silicon, Hardware Security, etc. |
| Paper Information | |
| Registration To | HWS |
| Conference Code | 2020-03-HWS-VLD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Causes of Entropy Loss on Non-IID PUFs and their Entropy Estimations (2) |
| Sub Title (in English) | |
| Keyword(1) | Physically Unclonable Function (PUF) |
| Keyword(2) | Min-Entropy |
| Keyword(3) | CMOS image sensor with a PUF (CIS PUF) |
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| 1st Author's Name | Mitsuru Shiozaki |
| 1st Author's Affiliation | Ritsumeikan University (Ritsumeikan Univ.) |
| 2nd Author's Name | Yohei Hori |
| 2nd Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 3rd Author's Name | Shunsuke Okura |
| 3rd Author's Affiliation | Ritsumeikan University (Ritsumeikan Univ.) |
| 4th Author's Name | Masayoshi Shirahata |
| 4th Author's Affiliation | Ritsumeikan University (Ritsumeikan Univ.) |
| 5th Author's Name | Takeshi Fujino |
| 5th Author's Affiliation | Ritsumeikan University (Ritsumeikan Univ.) |
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| Speaker | Author-1 |
| Date Time | 2020-03-07 10:55:00 |
| Presentation Time | 25 minutes |
| Registration for | HWS |
| Paper # | VLD2019-139, HWS2019-112 |
| Volume (vol) | vol.119 |
| Number (no) | no.443(VLD), no.444(HWS) |
| Page | pp.263-268 |
| #Pages | 6 |
| Date of Issue | 2020-02-26 (VLD, HWS) |
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