Paper Abstract and Keywords |
Presentation |
2020-07-02 15:20
Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2020-15 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
The threat of electromagnetic (EM) information leakage has been focused on the acquisition of information inside the devices, which is contained in the EM fields emitted unintentionally during the operations of the devices. In contrast, this paper focuses on information leakage caused by EM emission generated by intentional electromagnetic interference. Specifically, this paper focuses on USB keyboards, which are widely used as input/output devices. It is shown that the leakage of information can be controlled by increasing the intensity of the radiated EM fields by increasing the intensity of the disturbance of a specific frequency, which includes the data processed in the keyboard. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
EM information leakage / Intentional electromagnetic interference / / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 120, no. 83, EMCJ2020-15, pp. 25-28, July 2020. |
Paper # |
EMCJ2020-15 |
Date of Issue |
2020-06-25 (EMCJ) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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EMCJ2020-15 |
Conference Information |
Committee |
EMCJ |
Conference Date |
2020-07-02 - 2020-07-02 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Online |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Young Scientist Meeting |
Paper Information |
Registration To |
EMCJ |
Conference Code |
2020-07-EMCJ |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference |
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EM information leakage |
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Intentional electromagnetic interference |
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1st Author's Name |
Shugo Kaji |
1st Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
2nd Author's Name |
Daisuke Fujimoto |
2nd Author's Affiliation |
Nara Institute of Science and Technology (NAIST) |
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Yuichi Hayashi |
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Nara Institute of Science and Technology (NAIST) |
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Speaker |
Author-1 |
Date Time |
2020-07-02 15:20:00 |
Presentation Time |
25 minutes |
Registration for |
EMCJ |
Paper # |
EMCJ2020-15 |
Volume (vol) |
vol.120 |
Number (no) |
no.83 |
Page |
pp.25-28 |
#Pages |
4 |
Date of Issue |
2020-06-25 (EMCJ) |
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