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Paper Abstract and Keywords
Presentation 2020-07-02 15:20
Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference
Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2020-15
Abstract (in Japanese) (See Japanese page) 
(in English) The threat of electromagnetic (EM) information leakage has been focused on the acquisition of information inside the devices, which is contained in the EM fields emitted unintentionally during the operations of the devices. In contrast, this paper focuses on information leakage caused by EM emission generated by intentional electromagnetic interference. Specifically, this paper focuses on USB keyboards, which are widely used as input/output devices. It is shown that the leakage of information can be controlled by increasing the intensity of the radiated EM fields by increasing the intensity of the disturbance of a specific frequency, which includes the data processed in the keyboard.
Keyword (in Japanese) (See Japanese page) 
(in English) EM information leakage / Intentional electromagnetic interference / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 83, EMCJ2020-15, pp. 25-28, July 2020.
Paper # EMCJ2020-15 
Date of Issue 2020-06-25 (EMCJ) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee EMCJ  
Conference Date 2020-07-02 - 2020-07-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Young Scientist Meeting 
Paper Information
Registration To EMCJ 
Conference Code 2020-07-EMCJ 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference 
Sub Title (in English)  
Keyword(1) EM information leakage  
Keyword(2) Intentional electromagnetic interference  
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1st Author's Name Shugo Kaji  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Daisuke Fujimoto  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Yuichi Hayashi  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2020-07-02 15:20:00 
Presentation Time 25 minutes 
Registration for EMCJ 
Paper # EMCJ2020-15 
Volume (vol) vol.120 
Number (no) no.83 
Page pp.25-28 
#Pages
Date of Issue 2020-06-25 (EMCJ) 


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