Paper Abstract and Keywords |
Presentation |
2020-07-17 15:00
Production of automatic measurement system for contact resistance and its measurement results
-- Contact resistance when switching 1 million times under small load condition -- Kiyoshi Yoshida, Koichiro Sawa (NIT), Kenji Suzuki (Fuji FA Comp. & Sys.) EMD2020-6 Link to ES Tech. Rep. Archives: EMD2020-6 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
In this study, we constructed an automatic measurement system for the contact resistance of electrical contacts. This system used measurement control software LabVIEW (National Instruments). In the experiments, the contact resistance of two types of electrical contacts mounted on the electromagnetic contactor was measured up to one million operations. The electromagnetic contactor has a total of four electrical contacts, two single contacts and two twin contacts. The experimental conditions were as follows: the power supply voltage was constant at 5 V, and the current was set at 10 mA. The open and close operation were set to 3 Hz, and the contact resistance was measured 10 times every 2000 times operation, and the average value was obtained. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Automatic Measurement / Contact Resistance / LabVIEW, / Electromagnetic Contactor / Electrical Contact / Twin Contact / Single Contact / |
Reference Info. |
IEICE Tech. Rep., vol. 120, no. 110, EMD2020-6, pp. 17-22, July 2020. |
Paper # |
EMD2020-6 |
Date of Issue |
2020-07-10 (EMD) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
EMD2020-6 Link to ES Tech. Rep. Archives: EMD2020-6 |
Conference Information |
Committee |
EMD |
Conference Date |
2020-07-17 - 2020-07-17 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Chitose-Arcadia-Plaza |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
EMD |
Conference Code |
2020-07-EMD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
Production of automatic measurement system for contact resistance and its measurement results |
Sub Title (in English) |
Contact resistance when switching 1 million times under small load condition |
Keyword(1) |
Automatic Measurement |
Keyword(2) |
Contact Resistance |
Keyword(3) |
LabVIEW, |
Keyword(4) |
Electromagnetic Contactor |
Keyword(5) |
Electrical Contact |
Keyword(6) |
Twin Contact |
Keyword(7) |
Single Contact |
Keyword(8) |
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1st Author's Name |
Kiyoshi Yoshida |
1st Author's Affiliation |
Nippon Institute of Technology (NIT) |
2nd Author's Name |
Koichiro Sawa |
2nd Author's Affiliation |
Nippon Institute of Technology (NIT) |
3rd Author's Name |
Kenji Suzuki |
3rd Author's Affiliation |
Fuji Electric FA Components & Systems (Fuji FA Comp. & Sys.) |
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Speaker |
Author-1 |
Date Time |
2020-07-17 15:00:00 |
Presentation Time |
25 minutes |
Registration for |
EMD |
Paper # |
EMD2020-6 |
Volume (vol) |
vol.120 |
Number (no) |
no.110 |
Page |
pp.17-22 |
#Pages |
6 |
Date of Issue |
2020-07-10 (EMD) |
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