IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2020-07-17 15:00
Production of automatic measurement system for contact resistance and its measurement results -- Contact resistance when switching 1 million times under small load condition --
Kiyoshi Yoshida, Koichiro Sawa (NIT), Kenji Suzuki (Fuji FA Comp. & Sys.) EMD2020-6 Link to ES Tech. Rep. Archives: EMD2020-6
Abstract (in Japanese) (See Japanese page) 
(in English) In this study, we constructed an automatic measurement system for the contact resistance of electrical contacts. This system used measurement control software LabVIEW (National Instruments). In the experiments, the contact resistance of two types of electrical contacts mounted on the electromagnetic contactor was measured up to one million operations. The electromagnetic contactor has a total of four electrical contacts, two single contacts and two twin contacts. The experimental conditions were as follows: the power supply voltage was constant at 5 V, and the current was set at 10 mA. The open and close operation were set to 3 Hz, and the contact resistance was measured 10 times every 2000 times operation, and the average value was obtained.
Keyword (in Japanese) (See Japanese page) 
(in English) Automatic Measurement / Contact Resistance / LabVIEW, / Electromagnetic Contactor / Electrical Contact / Twin Contact / Single Contact /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 110, EMD2020-6, pp. 17-22, July 2020.
Paper # EMD2020-6 
Date of Issue 2020-07-10 (EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EMD2020-6 Link to ES Tech. Rep. Archives: EMD2020-6

Conference Information
Committee EMD  
Conference Date 2020-07-17 - 2020-07-17 
Place (in Japanese) (See Japanese page) 
Place (in English) Chitose-Arcadia-Plaza 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To EMD 
Conference Code 2020-07-EMD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Production of automatic measurement system for contact resistance and its measurement results 
Sub Title (in English) Contact resistance when switching 1 million times under small load condition 
Keyword(1) Automatic Measurement  
Keyword(2) Contact Resistance  
Keyword(3) LabVIEW,  
Keyword(4) Electromagnetic Contactor  
Keyword(5) Electrical Contact  
Keyword(6) Twin Contact  
Keyword(7) Single Contact  
Keyword(8)  
1st Author's Name Kiyoshi Yoshida  
1st Author's Affiliation Nippon Institute of Technology (NIT)
2nd Author's Name Koichiro Sawa  
2nd Author's Affiliation Nippon Institute of Technology (NIT)
3rd Author's Name Kenji Suzuki  
3rd Author's Affiliation Fuji Electric FA Components & Systems (Fuji FA Comp. & Sys.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2020-07-17 15:00:00 
Presentation Time 25 minutes 
Registration for EMD 
Paper # EMD2020-6 
Volume (vol) vol.120 
Number (no) no.110 
Page pp.17-22 
#Pages
Date of Issue 2020-07-10 (EMD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan