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Paper Abstract and Keywords
Presentation 2020-09-03 11:45
[Short Paper] Coarse-to-Fine Cephalometric Landmark Detection Using a Deep Learning Method
Yu Song (Ritsumeikan Univ.), Xu Qiao (SDU.), Yutaro Iwamoto, Yen-wei Chen (Ritsumeikan Univ.) MI2020-26
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
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Reference Info. IEICE Tech. Rep., vol. 120, no. 156, MI2020-26, pp. 39-41, Sept. 2020.
Paper # MI2020-26 
Date of Issue 2020-08-27 (MI) 
ISSN Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee MI  
Conference Date 2020-09-03 - 2020-09-03 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Medical Image Analysis 
Paper Information
Registration To MI 
Conference Code 2020-09-MI 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Coarse-to-Fine Cephalometric Landmark Detection Using a Deep Learning Method 
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1st Author's Name Yu Song  
1st Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
2nd Author's Name Xu Qiao  
2nd Author's Affiliation Shandong University (SDU.)
3rd Author's Name Yutaro Iwamoto  
3rd Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
4th Author's Name Yen-wei Chen  
4th Author's Affiliation Ritsumeikan University (Ritsumeikan Univ.)
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Date Time 2020-09-03 11:45:00 
Presentation Time 15 minutes 
Registration for MI 
Paper # MI2020-26 
Volume (vol) vol.120 
Number (no) no.156 
Page pp.39-41 
#Pages
Date of Issue 2020-08-27 (MI) 


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