Paper Abstract and Keywords |
Presentation |
2020-10-26 14:55
Physical-Level Detection Approach against Hardware Trojans inside Semiconductor Chips (II) Hirofumi Sakane, Shinichi Kawamura, Kentaro Imafuku, Yohei Hori, Makoto Nagata, Yuichi Hayashi, Tsutomu Matsumoto (AIST) HWS2020-35 ICD2020-24 Link to ES Tech. Rep. Archives: ICD2020-24 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
Hardware Trojans, known to be designed and crafted with malicious intent and deployed to be part of the hardware of the victim’s information systems, have become real threats. In this paper, we will discuss IC failure analysis and reverse-engineering techniques as methods and tools for detecting Hardware Trojans in IC chips after production. We will further dive into the optical analysis techniques, which are part of the traditional failure analysis tools. We demonstrate that an efficient and cost-effective realization of Hardware Trojan detection technique can be developed, taking advantage of some optical measurement features. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Hardware Trojan / Semiconductor Chip / Physical Level / Detection / Optical Analysis / / / |
Reference Info. |
IEICE Tech. Rep., vol. 120, no. 211, HWS2020-35, pp. 59-64, Oct. 2020. |
Paper # |
HWS2020-35 |
Date of Issue |
2020-10-19 (HWS, ICD) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
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HWS2020-35 ICD2020-24 Link to ES Tech. Rep. Archives: ICD2020-24 |
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