Paper Abstract and Keywords |
Presentation |
2021-01-29 14:55
Curvature measurement of flexible array probe using sheet type sensor for bending Yuusuke Tanaka, Daisuke Hirano, Yoshiaki Iwata, Yukio Ogura (Japan Probe) US2020-60 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
(Not available yet) |
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Reference Info. |
IEICE Tech. Rep., vol. 120, no. 355, US2020-60, pp. 15-20, Jan. 2021. |
Paper # |
US2020-60 |
Date of Issue |
2021-01-22 (US) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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US2020-60 |
Conference Information |
Committee |
US |
Conference Date |
2021-01-29 - 2021-01-29 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Online |
Topics (in Japanese) |
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Paper Information |
Registration To |
US |
Conference Code |
2021-01-US |
Language |
Japanese |
Title (in Japanese) |
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Title (in English) |
Curvature measurement of flexible array probe using sheet type sensor for bending |
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1st Author's Name |
Yuusuke Tanaka |
1st Author's Affiliation |
Japan Probe Co., Ltd. (Japan Probe) |
2nd Author's Name |
Daisuke Hirano |
2nd Author's Affiliation |
Japan Probe Co., Ltd. (Japan Probe) |
3rd Author's Name |
Yoshiaki Iwata |
3rd Author's Affiliation |
Japan Probe Co., Ltd. (Japan Probe) |
4th Author's Name |
Yukio Ogura |
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Japan Probe Co., Ltd. (Japan Probe) |
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Speaker |
Author-1 |
Date Time |
2021-01-29 14:55:00 |
Presentation Time |
25 minutes |
Registration for |
US |
Paper # |
US2020-60 |
Volume (vol) |
vol.120 |
Number (no) |
no.355 |
Page |
pp.15-20 |
#Pages |
6 |
Date of Issue |
2021-01-22 (US) |
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