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| Paper Abstract and Keywords | ||
| Presentation | 2021-03-04 17:15 Fundamental Study on Evaluation of EM Information Leakage from Smart Speakers with Different Installation Environments and Its Countermeasures Shogo Fukushima, Daisuke Fujimoto, Yuichi Hayashi (NAIST)  VLD2020-91 HWS2020-66 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Conventional studies on EM information leakage have mainly focused on only individual information devices. On the other hand, the EM radiation emitted from a device is affected by the EM environment inside and outside the device, and the installation environment of the device may affect the EM wave leakage. In this paper, we focus on the smart speaker, which is expected to be installed in a different environment for each user and may handle personal information and investigate the influence of the device's installation environment on the EM information leakage. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | EM Information Leakage / Smart Speaker / Installation Environment / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 120, no. 401, HWS2020-66, pp. 130-135, March 2021. | |
| Paper # | HWS2020-66 | |
| Date of Issue | 2021-02-24 (VLD, HWS) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | VLD2020-91 HWS2020-66 |
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| Conference Information | |
| Committee | HWS VLD |
| Conference Date | 2021-03-03 - 2021-03-04 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Design Technology for System-on-Silicon, Hardware Security, etc. |
| Paper Information | |
| Registration To | HWS |
| Conference Code | 2021-03-HWS-VLD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fundamental Study on Evaluation of EM Information Leakage from Smart Speakers with Different Installation Environments and Its Countermeasures |
| Sub Title (in English) | |
| Keyword(1) | EM Information Leakage |
| Keyword(2) | Smart Speaker |
| Keyword(3) | Installation Environment |
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| 1st Author's Name | Shogo Fukushima |
| 1st Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 2nd Author's Name | Daisuke Fujimoto |
| 2nd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
| 3rd Author's Name | Yuichi Hayashi |
| 3rd Author's Affiliation | Nara Institute of Science and Technology (NAIST) |
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| Speaker | Author-1 |
| Date Time | 2021-03-04 17:15:00 |
| Presentation Time | 25 minutes |
| Registration for | HWS |
| Paper # | VLD2020-91, HWS2020-66 |
| Volume (vol) | vol.120 |
| Number (no) | no.400(VLD), no.401(HWS) |
| Page | pp.130-135 |
| #Pages | 6 |
| Date of Issue | 2021-02-24 (VLD, HWS) |
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